Webinar: Efficient and Robust Memory Verification in Modern SoCs Using Formal Equivalence Checker

Webinar: Efficient and Robust Memory Verification in Modern SoCs Using Formal Equivalence Checker
by Admin on 11-05-2024 at 5:51 pm

With the increasing complexity and importance of memories in modern ICs, there is a clear need for specialized tools and techniques for the design and verification of embedded memory blocks. Traditional methods like SPICE simulation and cell-based formal verification have limitations; SPICE offers circuit-level accuracy

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Webinar: Efficient and Robust Memory Verification in Modern SoCs Using Formal Equivalence Checker

Webinar: Efficient and Robust Memory Verification in Modern SoCs Using Formal Equivalence Checker
by Admin on 10-20-2024 at 6:05 pm

With the increasing complexity and importance of memories in modern ICs, there is a clear need for specialized tools and techniques for the design and verification of embedded memory blocks. Traditional methods like SPICE simulation and cell-based formal verification have limitations; SPICE offers circuit-level accuracy

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FMS: the Future of Memory and Storage

FMS: the Future of Memory and Storage
by Admin on 06-21-2024 at 3:13 pm

FMS: the Future of Memory and Storage has expanded the scope of Flash Memory Summit to encompass all tiers of Memory and Storage. As a leading global independent conference and exhibition, FMS is now in its 18th year, offering enhanced support to the industry. Serving as a centralized hub for professional growth, industry connections,… Read More


16th IEEE International Memory Workshop 2024

16th IEEE International Memory Workshop 2024
by Admin on 05-06-2024 at 4:26 pm

The 16th IEEE International Memory Workshop (IEEE IMW) will be held in 2024 in Seoul. It is currently planned as an on-site event. This conference brings the memory community together in a workshop environment to discuss the memory process and design technologies, applications, market needs and strategies. It is sponsored by… Read More


Expedera Proposes Stable Diffusion as Benchmark for Edge Hardware for AI

Expedera Proposes Stable Diffusion as Benchmark for Edge Hardware for AI
by Bernard Murphy on 02-05-2024 at 6:00 am

Stable diffusion image min

A recent TechSpot article suggests that Apple is moving cautiously towards release of some kind of generative AI, possibly with iOS 18 and A17 Pro. This is interesting not just for Apple users like me but also for broader validation of a real mobile opportunity for generative AI. Which honestly had not seemed like a given, for multiple… Read More


LAM Not Yet at Bottom Memory Worsening Down 50%

LAM Not Yet at Bottom Memory Worsening Down 50%
by Robert Maire on 04-24-2023 at 10:00 am

LAM RESEARCH Vantex external chamber lrg 300x300

-Lam reported in line results on reduced expectations
-Guidance disappoints as memory decline continues
-Memory capex down 50% but still sees “further declines”
-Lam ties future to EUV maybe not good idea after ASML report

Lam comes in above grossly already reduced expectations
and misses on guidance

We always … Read More


Can Threshold Switches Replace Transistors in the Memory Cell?

Can Threshold Switches Replace Transistors in the Memory Cell?
by Fred Chen on 06-08-2020 at 6:00 am

Threshold switch I V

The overwhelming majority of transistors produced in the world are used in memory cells, either as the memory itself (Flash, SRAM), or as the access device (DRAM). Yet, it is not necessary to have a transistor in every memory cell. In 2015, 3D XPoint, the first major product based on transistor-less memory cells, was announced [1].

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Lithography Resolution Limits – Arrayed Features

Lithography Resolution Limits – Arrayed Features
by Fred Chen on 04-17-2020 at 6:00 am

Lithography Resolution Limits Arrayed Features

State-of-the-art chips will always include some portions which are memory arrays, which also happen to be the densest portions of the chip. Arrayed features are the main targets for lithography evaluation, as the feature pitch is well-defined, and is directly linked to the cost scaling (more features per wafer) from generation… Read More