Beyond the Post-Mortem: How yieldHUB Live Turns the Test Floor Into an Open Window

Beyond the Post-Mortem: How yieldHUB Live Turns the Test Floor Into an Open Window
by Lauro Rizzatti on 10-21-2026 at 10:00 am

Live visibility on the semiconductor test floor (1)

At SEMICON West 2026 I sat down with John O’Donnell, founder and CEO, and Gillian O’Donnell, Director of Growth, to talk about how yieldHUB Live is transforming the semiconductor test floor from a blind spot into a real-time command center.

For decades, semiconductor test floors have operated as high-stakes black… Read More


Semiconductor Fabrication Module Optimization

Semiconductor Fabrication Module Optimization
by Pawan Fangaria on 11-11-2013 at 9:00 am

The growing process integration complexity at each technology node has increased development time and cost, and this trend looks to continue. There is a looming risk of delivering unrepeatable critical unit processes (or process modules) that would require revisiting development and manufacturing requalification or in … Read More


How to Quickly Optimize BEOL Process at Your Desk?

How to Quickly Optimize BEOL Process at Your Desk?
by Pawan Fangaria on 09-30-2013 at 11:00 am

Engineers are always looking to improve the efficiency of how they work, but don’t want to sacrifice accuracy in the process. This is true in the world of semiconductor process development, where traditional build-and-test cycles are both time and resource intensive. But what if there was a way to do certain steps in a ‘virtual’… Read More