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Three Key Takeaways from the 2022 TSMC Technical Symposium!

Three Key Takeaways from the 2022 TSMC Technical Symposium!
by Daniel Nenni on 06-16-2022 at 12:10 pm

TSMC Technology Roadmap 2022

The TSMC Technical Symposium is today so I wanted to give you a brief summary of what was presented. Tom Dillinger will do a more technical review as he has done in the past. I don’t want to steal his thunder but here is what I think are the key takeaways. First a brief history lesson.

The history of TSMC Technology Development with 12 keyRead More


Intel 4 Deep Dive

Intel 4 Deep Dive
by Scotten Jones on 06-13-2022 at 6:00 am

Figure 1

As I previously wrote about here, Intel is presenting their Intel 4 process at the VLSI Technology conference. Last Wednesday Bernhard Sell (Ben) from Intel gave the press a briefing on the process and provided us with early access to the paper (embargoed until Sunday 6/12).

“Intel 4 CMOS Technology Featuring Advanced FinFET TransistorsRead More


An Update on In-Line Wafer Inspection Technology

An Update on In-Line Wafer Inspection Technology
by Tom Dillinger on 06-06-2022 at 6:00 am

inspection overview

From initial process technology development (TD) to high volume manufacturing (HVM) status for a new node, one of the key support functions to improve and maintain yield is the in-line wafer inspection technology.  Actually, there are multiple inspection technologies commonly employed, with tradeoffs in pixel resolution,… Read More


Inverse Lithography Technology – A Status Update from TSMC

Inverse Lithography Technology – A Status Update from TSMC
by Tom Dillinger on 06-02-2022 at 6:00 am

ILT mask rules

“Inverse lithography technology (ILT) represents the most significant EDA advance in the last two decades.”  Danping Peng from TSMC made that assertion at the recent SPIE Advanced Lithography + Patterning Conference, in his talk entitled:  ILT for HVM:  History, Present, and Future.  This article summarizes the highlights… Read More


0.55 High-NA Lithography Update

0.55 High-NA Lithography Update
by Tom Dillinger on 05-31-2022 at 6:00 am

mask infrastructure 0 55

At the recent SPIE Advanced Lithography + Patterning Conference, Mark Phillips from Intel gave an insightful update on the status of the introduction of the 0.55 high numerical aperture extreme ultraviolet lithography technology.  Mark went so far as to assert that the development progress toward high-NA EUV would support … Read More


TSMC N3 will be a Record Setting Node!

TSMC N3 will be a Record Setting Node!
by Daniel Nenni on 05-19-2022 at 6:00 am

waferr007 2518 Q9Wf 0

With the TSMC Technical Symposium coming next month there is quite a bit of excitement inside the fabless semiconductor ecosystem. Not only will TSMC give an update on N3, we should also hear details of the upcoming N2 process.

Hopefully TSMC will again share the number of tape-outs confirmed for their latest process node. Given… Read More


Intel and the EUV Shortage

Intel and the EUV Shortage
by Scotten Jones on 04-13-2022 at 10:00 am

Slide1

In my “The EUV Divide and Intel Foundry Services” article available here, I discussed the looming EUV shortage. Two days ago, Intel announced their first EUV tool installed at their new Fab 34 in Ireland is a tool they moved from Oregon. This is another indication of the scarcity of EUV tools.

I have been tracking EUV system production… Read More


Can Intel Catch TSMC in 2025?

Can Intel Catch TSMC in 2025?
by Scotten Jones on 04-11-2022 at 6:00 am

Slide6

At the ISS conference held from April 4th through 6th I presented on who I thought would have the leading logic technology in 2025. The following is a write up of that presentation.

ISS was a virtual conference in 2021 and I presented on who currently had logic leadership and declared TSMC the clear leader. Following that conference,… Read More


Intel Best Practices for Formal Verification

Intel Best Practices for Formal Verification
by Daniel Nenni on 04-07-2022 at 6:00 am

formal dynamic verification comparison

Dynamic event-based simulation of RTL models has traditionally been the workhorse verification methodology.  A team of verification engineers interprets the architectural specification to write testbenches for various elements of the design hierarchy.  Test environments at lower levels are typically exercised then … Read More


TSMC’s Reliability Ecosystem

TSMC’s Reliability Ecosystem
by Tom Dillinger on 04-06-2022 at 10:00 am

AC accelerated stress conditions

TSMC has established a leadership position among silicon foundries, based on three foundational principles:

  • breadth of technology support
  • innovation in technology development
  • collaboration with customers

Frequent SemiWiki readers have seen how these concepts have been applied to the fabrication and packaging technology… Read More