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Tesla: Kick-ass Radio in an EV

Tesla: Kick-ass Radio in an EV
by Roger C. Lanctot on 01-29-2022 at 6:00 am

Tesla Kick ass Radio in an EV

It seems that all we hear about over-the-air radio broadcasts in electric vehicles is that AM is going away due to interference and FM is irrelevant due to streaming apps. Tesla has very affirmatively upended this conventional wisdom with an over-the-air update that adds Xperi’s DTS AutoStage to most Tesla’s.

This… Read More


Podcast EP59: A brief history of semiconductors and EDA with Rich Goldman

Podcast EP59: A brief history of semiconductors and EDA with Rich Goldman
by Daniel Nenni on 01-28-2022 at 10:00 am

Dan is joined by good friend and fellow boater Rich Goldman. Rich has a storied career in EDA that began at TI with Morris Chang and Wally Rhines, continued through a long career at Synopsys and included a book collaboration with Neil Armstrong, Stephen Hawking and Brian May (the lead guitarist for Queen),

Dan and Rich cover a lot … Read More


WEBINAR: How to add a NIST-Certified Random Number Generator to any IoT device?

WEBINAR: How to add a NIST-Certified Random Number Generator to any IoT device?
by Daniel Nenni on 01-28-2022 at 6:00 am

Intrinsic ID Webinar Blog

In the first half of 2021, the number of attacks on IoT devices more than doubled to 1.5 billion attacks in just six months. These attacks target some typical weaknesses, such as the use of weak passwords, lack of regular patches and updates, insecure interfaces, and insufficient data protection. However, researchers from Bishop… Read More


SIP Modules Solve Numerous Scaling Problems – But Introduce New Issues

SIP Modules Solve Numerous Scaling Problems – But Introduce New Issues
by Tom Simon on 01-27-2022 at 10:00 am

SIP Verification

Multi-chip modules are now more important than ever, even though the basic concept has been around for decades. With The effects of Moore’s Law and other factors such as yield, power, and process choices, reasons for dividing what once would have been a single SOC into multiple die and integrating them in a single module have become… Read More


Samsung Keynote at IEDM

Samsung Keynote at IEDM
by Scotten Jones on 01-27-2022 at 6:00 am

Samsung Keynote Figure 1

Kinam Kim is a longtime Samsung technologist who has published many excellent articles over the years. He is now the Chairman of Samsung Electronics, and he gave a very interesting keynote address at IEDM.

He began with some general observations:

The world is experiencing a transformation powered by semiconductors that has been… Read More


Upcoming Webinar: 3DIC Design from Concept to Silicon

Upcoming Webinar: 3DIC Design from Concept to Silicon
by Kalar Rajendiran on 01-26-2022 at 10:00 am

Lessons from Existing Multi Die Solutions

Multi-die design is not a new concept. It has been around for a long time and has evolved from 2D level integration on to 2.5D and then to full 3D level implementations. Multiple driving forces have led to this progression.  Whether the forces are driven by market needs, product needs, manufacturing technology availability or EDA… Read More


The Hitchhiker’s Guide to HFSS Meshing

The Hitchhiker’s Guide to HFSS Meshing
by Matt Commens on 01-26-2022 at 6:00 am

PCB

Automatic adaptive meshing in Ansys HFSS is a critical component of its finite element method (FEM) simulation process. Guided by Maxwell’s Equations, it efficiently refines a mesh to deliver a reliable solution, guaranteed. Engineers around the world count on this technology when designing cutting-edge electronic products.… Read More


MBIST Power Creates Lurking Danger for SOCs

MBIST Power Creates Lurking Danger for SOCs
by Tom Simon on 01-25-2022 at 10:00 am

MBIST power emulation

The old phrase that the cure is worse than the disease is apropos when discussing MBIST for large SOCs where running many MBIST tests in parallel can exceed power distribution network (PDN) capabilities. Memory Built-In Self-Test (MBIST) usually runs automatically during power on events. Due to the desire to speed up test and … Read More


Business Considerations in Traceability

Business Considerations in Traceability
by Bernard Murphy on 01-25-2022 at 6:00 am

nuclear power control room min

Traceability as an emerging debate around hardware is gaining a lot of traction. As a reminder, traceability is the need to support a disciplined ability to trace from initial OEM requirements down through the value chain to implementation support and confirmed verification in software and hardware. Demand for traceability… Read More


How System Companies are Re-shaping the Requirements for EDA

How System Companies are Re-shaping the Requirements for EDA
by Kalar Rajendiran on 01-24-2022 at 10:00 am

Panelists and Cadence Moderator

As the oldest and largest EDA conference, the Design Automation Conference (DAC) brings the best minds together to present, discuss, showcase and debate the latest and greatest advances in EDA. It accomplishes this in the form of technical papers, talks, company booths, product pavilions and panel discussions.

A key aspect … Read More