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DAC 2021 – Cliosoft Overview

DAC 2021 – Cliosoft Overview
by Daniel Payne on 12-30-2021 at 6:00 am

Simon and Karim min

It’s been awhile since I really looked at what Cliosoft has to offer in the EDA tool space, so at the 58th DAC I stopped by their exhibit booth on Tuesday to visit with Karim Khalfan, VP of Application Engineering, and Simon Rance, VP of Marketing. Their booth had all of the hot market segments listed: Automotive, 5G, IoT, AI, … Read More


Heterogeneous Integration – A Cost Analysis

Heterogeneous Integration – A Cost Analysis
by Tom Dillinger on 12-29-2021 at 10:00 am

cost comparison

Heterogeneous integration (HI) is a general term used to represent the diverse possibilities for die technology incorporated into advanced 2.5D/3D packaging.  At the recent International Electron Devices Meeting (IEDM) in San Francisco, a team from Synopsys and IC Knowledge presented data from analyses of future potential… Read More


Methodology for Aging-Aware Static Timing Analysis

Methodology for Aging-Aware Static Timing Analysis
by Tom Dillinger on 12-28-2021 at 10:00 am

char STA flow

At the recent Design Automation Conference, Cadence presented their methodology for incorporating performance degradation measures due to device aging into a static timing analysis flow. [1] (The work was a collaborative project with Samsung Electronics.)  This article reviews the highlights of their presentation.

BackgroundRead More


Delivering Systemic Innovation to Power the Era of SysMoore

Delivering Systemic Innovation to Power the Era of SysMoore
by Kalar Rajendiran on 12-28-2021 at 6:00 am

Evolving Landscape

With the slowing down of Moore’s law , the industry as a whole has been working on various ways to maintain the rate of growth and advancements. A lot has been written up about various solutions being pursued to address specific aspects. The current era is being referred to by different names, SysMoore being one that Synopsys uses.… Read More


DAC 2021 – Taming Process Variability in Semiconductor IP

DAC 2021 – Taming Process Variability in Semiconductor IP
by Daniel Payne on 12-27-2021 at 10:00 am

process node variability min

Tuesday at DAC was actually my very first time attending a technical session, and the presentation from Nebabie Kebebew, Siemens EDA, was called, Mitigating Variability Challenges of IPs for Robust Designs. There were three presentations scheduled for that particular Designer, IP and Embedded Systems track, but with the COVID… Read More


AI for EDA for AI

AI for EDA for AI
by Daniel Nenni on 12-24-2021 at 6:00 am

Agnisys AI EDA AI

I’ve been noticing over the last few years that electronic design automation (EDA) vendors just love to talk about artificial intelligence (AI) and machine learning (ML), sometimes with deep learning (DL) and neural networks tossed in as well. It can get a bit confusing since these terms are used in two distinct contexts. The first… Read More


Scalable Concolic Testing. Innovation in Verification

Scalable Concolic Testing. Innovation in Verification
by Bernard Murphy on 12-23-2021 at 10:00 am

Scalable Concolic Testing

Combining simulation and symbolic methods is an attractive way to excite rare branches in block-level verification, but is this method really scalable? Paul Cunningham (GM, Verification at Cadence), Raúl Camposano (Silicon Catalyst, entrepreneur, former Synopsys CTO) and I continue our series on research ideas. As always,… Read More


Cut Out the Cutouts

Cut Out the Cutouts
by Aaron Edwards on 12-23-2021 at 6:00 am

ANSYS HFSS 3D Layout 1

In 2014, many of the customers that my team and I supported in North America were still using HFSS 3D to model boards and packages. These customers were content with that interface, able to get their models setup quickly, and were okay with the solution times because when HFSS gave them an answer, they knew it was the right answer. I … Read More


More Than Moore and Charting the Path Beyond 3nm

More Than Moore and Charting the Path Beyond 3nm
by Kalar Rajendiran on 12-22-2021 at 10:00 am

Cadence AIML Technologies

The incredible growth that the semiconductor industry has enjoyed over the last several decades is attributed to Moore’s Law. While no one argues that point, there is also industry wide acknowledgment that Moore’s Law started slowing down around the 7nm process node. While die-size reductions still scale, performance jumps… Read More


DAC 2021 – Siemens EDA talks about using the Cloud

DAC 2021 – Siemens EDA talks about using the Cloud
by Daniel Payne on 12-21-2021 at 10:00 am

Craig Johnson

My third event at DAC on Monday was all about using EDA tools in the Cloud, and so I listened to Craig Johnson, VP EDA Cloud Solutions, Siemens EDA. Early in the day I heard from Joe Sawicki, Siemens EDA, on the topic of Digitalization.

Why even use the Cloud for EDA? That’s a fair question to ask, and Craig had several high-level… Read More