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WP_Term Object
(
    [term_id] => 157
    [name] => EDA
    [slug] => eda
    [term_group] => 0
    [term_taxonomy_id] => 157
    [taxonomy] => category
    [description] => Electronic Design Automation
    [parent] => 0
    [count] => 4234
    [filter] => raw
    [cat_ID] => 157
    [category_count] => 4234
    [category_description] => Electronic Design Automation
    [cat_name] => EDA
    [category_nicename] => eda
    [category_parent] => 0
    [is_post] => 
)

Its a bouncing baby IEEE standard!

Its a bouncing baby IEEE standard!
by Beth Martin on 11-04-2014 at 12:00 am

Pass the cigars! On November 3rd, 2014, the IEEE-SA Standards Board finally approved IEEE P1687 as a new standard. From now on, you can drop the “P” and just call it 1687, or to its friends, IJTAG. Now would be a good time to sign up for an IJTAG technical workshop.

The new IEEE 1687 Internal JTAG (IJTAG) standard is changing… Read More


Improve Test Robustness & Coverage Early in Design

Improve Test Robustness & Coverage Early in Design
by Pawan Fangaria on 11-03-2014 at 5:00 pm

In a semiconductor design, keeping the design testable with high test coverage has always been a requirement. However with shrinking technology nodes and large, dense SoC designs and complex logic structures, while it has become mandatory to reach close to 100% test coverage, it’s extremely difficult to cope with the explosion… Read More


What Presentations to Attend During IP-SoC 2014 ?

What Presentations to Attend During IP-SoC 2014 ?
by Eric Esteve on 11-01-2014 at 11:00 am

Will you go to Grenoble next week to attend to IP-SoC? I will do it and will certainly listen to these Keynote Talks:

Read More

Noise & Reliability of FinFET Designs – Success Stories!

Noise & Reliability of FinFET Designs – Success Stories!
by Pawan Fangaria on 11-01-2014 at 7:00 am

I think by now there has been good level of discussion on FinFET technology at sub-20 nm process nodes and this is an answer to ultra dense, high performance, low power, and billion+ gate SoC designs within the same area. However, it comes with some of the key challenges with respect to power, noise and reliability of the design. A FinFET… Read More


Debugging a 10 bit SAR ADC

Debugging a 10 bit SAR ADC
by Daniel Payne on 10-31-2014 at 4:00 pm

SMIC (Semiconductor Manufacturing International Corporation) is a China-based foundry with technology ranging from 0.35 micron to 28 nm, and we’ve blogged about them before on SemiWiki. I’ve been reading about SMIC recently because they created a technical presentation for the MunEDA Technical Forum Shanghai… Read More


Effective Bug Tracking with IP Sub-systems

Effective Bug Tracking with IP Sub-systems
by Daniel Payne on 10-31-2014 at 7:00 am

Designing an SoC sounds way more exciting than bug tracking, but let’s face it – any bug has the potential to make your silicon fail, so we need to take a serious look at the approaches to bug tracking. When using an IP or an IP subsystem in a design, the SoC integrators require some critical knowledge about this IP. The actual… Read More


Silvaco at the TSMC 2014 Open Innovation Platform

Silvaco at the TSMC 2014 Open Innovation Platform
by Daniel Payne on 10-31-2014 at 7:00 am

The success of our semiconductor eco-system depends on collaboration, so the annual TSMC OIP Event just held on September 30 at the San Jose Convention Center was a prime example of that. I didn’t attend this year, but I did follow up with Amit Nandaof Silvaco this week to hear about what they presented. As a consultant I’ve… Read More


Improving Verification by Combining Emulation with ABV

Improving Verification by Combining Emulation with ABV
by Tom Simon on 10-30-2014 at 4:00 pm

Chip deadlines and the time to achieve sufficient verification coverage run continuously in a tight loop like a dog chasing its tail. Naturally it is exciting when innovative technologies can be combined so that verification can gain an advantage. Software based design simulators have been the mainstay of verification methodologies.… Read More


Adding a Digital Block to an Analog Design

Adding a Digital Block to an Analog Design
by Daniel Payne on 10-30-2014 at 7:00 am

My engineering background includes designing at the transistor-level, so I was drawn to attend a webinar today presented by Tanner EDAand Incentia about Adding a Digital Block to an Analog Design. Many of the 30,000 users of Tanner tools have been doing AMS designs, so adding logic synthesis and static timing analysis from IncentiaRead More


Cadence Mixed Signal Technology Forum

Cadence Mixed Signal Technology Forum
by Paul McLellan on 10-29-2014 at 7:00 am

Yesterday was Cadence’s annual mixed-signal technology forum. I think that there was a definite theme running through many of the presentations, namely that wireless communication of one kind or another is on a sharp rise with more and more devices needing to connect to WiFi, Bluetooth and so on. This was most obvious during… Read More