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WP_Term Object
(
[term_id] => 157
[name] => EDA
[slug] => eda
[term_group] => 0
[term_taxonomy_id] => 157
[taxonomy] => category
[description] => Electronic Design Automation
[parent] => 0
[count] => 4234
[filter] => raw
[cat_ID] => 157
[category_count] => 4234
[category_description] => Electronic Design Automation
[cat_name] => EDA
[category_nicename] => eda
[category_parent] => 0
[is_post] =>
)
Pass the cigars! On November 3rd, 2014, the IEEE-SA Standards Board finally approved IEEE P1687 as a new standard. From now on, you can drop the “P” and just call it 1687, or to its friends, IJTAG. Now would be a good time to sign up for an IJTAG technical workshop.
The new IEEE 1687 Internal JTAG (IJTAG) standard is changing… Read More
In a semiconductor design, keeping the design testable with high test coverage has always been a requirement. However with shrinking technology nodes and large, dense SoC designs and complex logic structures, while it has become mandatory to reach close to 100% test coverage, it’s extremely difficult to cope with the explosion… Read More
Will you go to Grenoble next week to attend to IP-SoC? I will do it and will certainly listen to these Keynote Talks:
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I think by now there has been good level of discussion on FinFET technology at sub-20 nm process nodes and this is an answer to ultra dense, high performance, low power, and billion+ gate SoC designs within the same area. However, it comes with some of the key challenges with respect to power, noise and reliability of the design. A FinFET… Read More
SMIC (Semiconductor Manufacturing International Corporation) is a China-based foundry with technology ranging from 0.35 micron to 28 nm, and we’ve blogged about them before on SemiWiki. I’ve been reading about SMIC recently because they created a technical presentation for the MunEDA Technical Forum Shanghai… Read More
Designing an SoC sounds way more exciting than bug tracking, but let’s face it – any bug has the potential to make your silicon fail, so we need to take a serious look at the approaches to bug tracking. When using an IP or an IP subsystem in a design, the SoC integrators require some critical knowledge about this IP. The actual… Read More
The success of our semiconductor eco-system depends on collaboration, so the annual TSMC OIP Event just held on September 30 at the San Jose Convention Center was a prime example of that. I didn’t attend this year, but I did follow up with Amit Nandaof Silvaco this week to hear about what they presented. As a consultant I’ve… Read More
Chip deadlines and the time to achieve sufficient verification coverage run continuously in a tight loop like a dog chasing its tail. Naturally it is exciting when innovative technologies can be combined so that verification can gain an advantage. Software based design simulators have been the mainstay of verification methodologies.… Read More
My engineering background includes designing at the transistor-level, so I was drawn to attend a webinar today presented by Tanner EDAand Incentia about Adding a Digital Block to an Analog Design. Many of the 30,000 users of Tanner tools have been doing AMS designs, so adding logic synthesis and static timing analysis from Incentia… Read More
Yesterday was Cadence’s annual mixed-signal technology forum. I think that there was a definite theme running through many of the presentations, namely that wireless communication of one kind or another is on a sharp rise with more and more devices needing to connect to WiFi, Bluetooth and so on. This was most obvious during… Read More
Weebit Nano Moves into the Mainstream with Customer Adoption