For companies who need to optimise yields, yieldHUB combines semiconductor industry expertise with the latest database, on premise and cloud technologies, to provide a cost effective complete solution.
- We are an Irish company with engineers and sales agents across the world.
- Customers include top 20 semiconductor companies such as Infineon, Microchip, On Semi and Rohm.
- We continuously invest in our people and our technology so that our customers profit from deeper and deeper insights into their manufacturing performance.
- Our Data Model is unique and hugely scalable. You analyse data without having to download it first. This means you can analyse hundreds of wafers worth of data in seconds though clever data processing and innovative database design.
- The analysis is done using your web-browser with no additional software needed for users.
- We provide leading support for Fabless, IDM and OSAT companies.
- Our On Premises option is popular for larger companies – our Cloud option for small to medium sized companies.
“It’s easy to operate and can provide diverse reports.” Senior Manager, GS Tek, New Taipei City, Taiwan, a loyal customer since 2010.
If you are thinking of developing your own in-house YMS, you could do worse than looking at this article first.
yieldHUB’s Platform
yieldHUB is a SaaS company (with an on premise option) that provides yield management and comprehensive data analysis for semiconductor companies. Our customers include leading fabless companies and IDMs worldwide.
We serve companies who work across the entire semiconductor industry, from Computer and Peripheral Devices to Consumer Electronics, Telecommunications Equipment, Industrial Electronics, Defence and Space and Transportation Technology.
yieldHUB’s Solutions
Traceability
Microchips have memory on board where a Unique Identification (UID) can be stored. yieldHUB’s traceability solution allows users to set up a recipe to interpret the data to build the UID information. This can include wafer lot ID, wafer ID, and wafer XY coordinates. With our platform, every chip is searchable instantly. If you get an RMA and serial number, we can find the entire manufacturing dataset! We give users the power to create wafer maps from final test data, allowing analysis such as bin flip or indexed correlation to identify changes in performance between wafer sort and final test.
Data cleansing
In semiconductor manufacturing there are huge volumes of data that come from various different sources and need to be analyzed by different people. The yieldHUB data pipeline and VIPER (VIrtual Product Engineer) do not only automate the management of that data but also the cleansing. It is important to be using clean data for analysis otherwise the conclusions reached might not be reliable. The data cleansing includes both standard data formats such as STDF and custom data formats used by our customers.
Parametric / Bin analysis
Data analysis is at the heart of any yield management strategy. yieldHUB offers top quality capabilities and reports for analyzing parametric and bin data. The capabilities go beyond the basic analysis of these data types and include the ability to search for wafers or lots with particular bin or parametric signatures; as well as creating trends of bin or parametric performance across hundreds or thousands of wafers in seconds.
Characterization
Characterization data can be far more complex than production data. This is because the test conditions are encoded in the data and each test can be tested under many conditions in characterization and therefore generates a lot of data. The yieldHUB platform has a sophisticated solution to automate the extraction of the conditions and provide a thorough characterization of each test with minimal setup.
Outlier detection
Outlier detection is primarily aimed at the automotive and aerospace industries with such algorithms as Dynamic Part Average Testing (DPAT) and Static Part Average Testing (SPAT). Special algorithms such as GDBN (and for example Lot Norm in the case of aerospace) can also be made available. yieldHUB’s outlier detection capabilities are seamless and efficient. When the AECQ standard algorithms do not fit your data yieldHUB allows you to add your own algorithms so the possibilities are limitless.
WAT / PCM
We receive a lot of enquiries about Wafer Acceptance Test data (WAT) or Process Control Monitoring data (PCM). yieldHUB has parsers (smart code to ingest data) for WAT / PCM data from all major Fabs and has specialist charts and reports developed specifically for semiconductor WAT data.
About yieldHUB
Our team of experts work around the world. Our Headquarters is in Limerick, Ireland and we have offices in the UK, the US, the Netherlands, Taiwan and the Philippines with sales agents also representing us in Korea and Japan. (We are currently on the look out for a partner for mainland China). Find out more about some of the key team members here:
JOHN O’DONNELL, CEO
John is an electronic engineer with much of his career spent in test development and product engineering. He holds several patents in the area of test development including a machine learning method in 1993 (although that terminology was not used then) to speed up testing of ADCs and DACs. John founded MFG Vision whose trading name became yieldHUB in 2018. User experience is of huge interest to John and a breakthrough of his career was when he realised in 2005 that big data analysis (although that terminology was also not used then) could be made much easier and faster if users did not have to download any data first and if much of what the engineer needed to do was predicted by the database designers. MFG Vision and now yieldHUB came out of that insight.
JEROME AUZA, DIRECTOR OF ENGINEERING
Jerome is a twenty year veteran of the semiconductor industry. He is our installer-in-chief at sites worldwide, and manages our Asian software and IT team. Jerome has particular expertise in data processing and databases. He enjoys traveling to our customers and training their IT teams where On Premises is the chosen option for yieldHUB deployment.
KEVIN ROBINSON, DIRECTOR OF CUSTOMER SUCCESS
Kevin is an expert in product and test engineering and our leader in Agile Software Development. He travels widely (except during the present pandemic!) and makes sure that our customers are benefiting to the max from our technology. He makes sure yieldHUB delivers what we promise to our customers on time and with high quality.
CARL MOORE, YIELD MANAGEMENT SPECIALIST
Carl has over 35 years in the Semiconductor industry, holding technical management positions in Product Engineering, Test, Assembly, Manufacturing, and Design. He is passionate about yield analysis, and has broad experience in manufacturing test, with over 300 days spent in Asia. In his spare time, Carl plays competitive Pickleball and enjoys competing in tournaments.
ENID CHEN, APPLICATION MANAGER
Enid Chen is an expert in foundry process engineering and IC design house product engineering and quality engineering. She studied chemical engineering in National University of Taiwan and works in engineering because she is interested in troubleshooting and team work
MICHAEL CLARKE, CUSTOMER SUCCESS MANAGER
Like a lot of us here, Michael comes from a product and test engineering background. He has a Bachelor’s degree in Astrophysics, Astronomy and Space Science and has worked in the automotive, photonics and image sensor industries. We all know he’s a genius, but we also like to think of him as our customer success superstar! Michael has a strong track record when it comes to connecting with our customers. His focus is on a growing number of leading edge customers in the UK, Europe and Israel. In his spare time he likes to enjoy time with family and keeps up with the latest advances in scientific research.
MADELAINE FINUCANE, MARKETING MANAGER
Madelaine is our marketing wiz and wordsmith. She has a knack for converting technical lingo into words that anyone can understand. Straight out of university, Madelaine dived into the world of marketing where she gained experience across various industries including time at a creative agency, a global elevator company and a strata management corporation in Australia. Before joining yieldHUB Madelaine worked as a journalist for a number of years where she covered breaking news, politics, court, and crime. When Madelaine’s not at her desk she likes to spend her spare time painting, writing and traveling.
MARIA TROCIO, QA DIRECTOR
Maria is known at yieldHUB as a go-getter who doesn’t mind a challenge. She began her career as a test engineer after being recruited while she was studying at university. From there, it didn’t take long for her to be promoted to team lead. Today, Maria has 17 years worth of experience in the industry and now heads yieldHUB’s QA team. As a team member, she’s never shy to put her hand up and share ideas with her team and she has demonstrated creative flare (which is an added bonus for us!). When she’s not working, she’s likely exploring the outdoors or working on her fitness. Some of her favorite activities include boxing and hiking where she is based in the Philippines. Her favourite quote is: “A well-defined problem is half the solution…but to have a well-defined problem is twice the problem”.
About yieldHUB
yieldHUB supplies world-class data analysis solutions to the semiconductor industry. For companies who design and manufacture semiconductors, the cloud-based software provides a complete understanding of their product performance and yields.
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