How to Simplify Complexities in Power Verification?

How to Simplify Complexities in Power Verification?
by Pawan Fangaria on 10-17-2013 at 11:00 am

With multiple functionalities added into a single chip, be it a SoC or an ASIC, maintaining low power consumption has become critical for any design. Various techniques at the technology as well as design level are employed to accomplish the low power target. These include thinner oxides in transistors, different sections of … Read More


What Can Accelerate 3D Semiconductor Manufacturing?

What Can Accelerate 3D Semiconductor Manufacturing?
by Pawan Fangaria on 10-12-2013 at 9:30 am

In the beginning of this decade there was a lot of buzz around 3D chip manufacturing. Many EDA tools were developed to facilitate semiconductor designs in 3D space. Naturally, we are moving to the edge on 2D without much room to further squeeze transistors and interconnect. However, lately I haven’t heard much about 3D products.… Read More


Cadence Grows VIP Business – What’s New?

Cadence Grows VIP Business – What’s New?
by Pawan Fangaria on 10-04-2013 at 10:00 am

VIPs (Verification IPs) are really important in this complex world of SoCs which involve various IPs, interfaces and continuously evolving protocols and standards, thus making the task of verifying an overall system extremely challenging. And the verification must be done in minimum possible run-time and memory consumption.… Read More


ST Endorses PowerArtist with ARM Cores & FDSOI libs

ST Endorses PowerArtist with ARM Cores & FDSOI libs
by Pawan Fangaria on 10-01-2013 at 12:00 pm

It was an interesting webinar I attended, presented by STMicroelectronicson how they are benefited in power saving and thermal dissipation by using FDSOI technology and also by using PowerArtist in their design. So, it’s an advantage from both sides – semiconductor technology and semiconductor design tool. It’s worth attending… Read More


But I Never Have Seen a Synchronizer Failure

But I Never Have Seen a Synchronizer Failure
by Jerry Cox on 09-24-2013 at 8:00 am

You may say, “Why should I worry about synchronizer failures when I have never seen one fail in a product?” Perhaps you feel that the dual-rank synchronizer used by many designers makes your design safe. Furthermore, those chips that have occasional unexpected failures never show any forensic evidence of synchronizer failures.… Read More


Develop A Complete System Prototype Using Vista VP

Develop A Complete System Prototype Using Vista VP
by Pawan Fangaria on 09-22-2013 at 6:00 pm

Yes, it means complete hardware and software integration, debugging, verification, optimization of performance and power and all other operational aspects of an electronic system in semiconductor design. In modern SoCs, several IPs, RTL blocks, software modules, firmware and so on sit together on a single chip, hence making… Read More


Early Test –> Less Expensive, Better Health, Faster Closure

Early Test –> Less Expensive, Better Health, Faster Closure
by Pawan Fangaria on 09-18-2013 at 11:00 am


I am talking about the health of electronic and semiconductor design, which if made sound at RTL stage, can set it right for the rest of the design cycle for faster closure and also at lesser cost. Last week was the week of ITC(International Test Conference) for the Semiconductor and EDA community. I was looking forward to what ITCRead More


Semiconductor Manufacturing in India?

Semiconductor Manufacturing in India?
by Pawan Fangaria on 09-15-2013 at 11:30 am


Last week I heard about the Indian Cabinet approving the proposal for setting up of two Fabs in India. One led by IBM, Tower Jazzand JP Associates(an Indian business house), and the other led by HSMC(Hindustan Semiconductor Manufacturing Co.), ST Microelectronicsand Silterra. Indian Semiconductor community including IESARead More


Emerging Trend – Choose DRAM as per Your Design Need

Emerging Trend – Choose DRAM as per Your Design Need
by Pawan Fangaria on 09-11-2013 at 7:00 pm

Lately I was studying about new innovations in memory world such as ReRAM and Memristor. As DRAM (although it has become a commodity) has found its extensive use in mobile, PC, tablet and so on, that was an inclination too to know more about. While reviewing Cadence’s offering in memory subsystems, I came across this whitepaperwhich… Read More


TSMC OIP: Soft Error Rate Analysis

TSMC OIP: Soft Error Rate Analysis
by Paul McLellan on 09-09-2013 at 1:34 pm

Increasingly, end users in some markets are requiring soft error rate (SER) data. This is a measure of how resistant the design (library, chip, system) is to single event effects (SEE). These manifest themselves as SEU (upset), SET (transient), SEL (latch-up), SEFI (functional interrupt).

There are two main sources that cause… Read More