How to Optimize Analog IPs for High-end SoCs?

How to Optimize Analog IPs for High-end SoCs?
by Pawan Fangaria on 01-07-2014 at 12:00 pm

Gone are the days when analog design had its sweet space on a single chip. However, it’s the main driver in this new electronic world which is geared by Internet-of-Things, wireless, mobile, remote control and so on. How does an electronic device sense a touch by human, motion, temperature, sound etc.? It’s the analog circuitry … Read More


Quick MEMS Development Through Virtual Fabrication

Quick MEMS Development Through Virtual Fabrication
by Pawan Fangaria on 01-01-2014 at 7:00 am

The design and manufacture of MEMS is very different and in many ways more complex process than even the most advanced ICs. MEMS involve multiple degrees of freedom (i.e. the device to exhibit different characteristics under different physical state, motion or mechanics), making fabrication of MEMS extremely complex; and hence… Read More


Highest Test Quality in Shortest Time – It’s Possible!

Highest Test Quality in Shortest Time – It’s Possible!
by Pawan Fangaria on 12-26-2013 at 10:30 am

Traditionally ATPG (Automatic Test Pattern Generation) and BIST (Built-In-Self-Test) are the two approaches for testing the whole semiconductor design squeezed on an IC; ATPG requires external test equipment and test vectors to test targeted faults, BIST circuit is implemented on chip along with the functional logic of IC.… Read More


DAC 2014: Designer Track/IP Call for Submissions

DAC 2014: Designer Track/IP Call for Submissions
by Daniel Nenni on 12-17-2013 at 8:00 pm

Yes, it is that time of year again, DAC is coming and it is in San Francisco so you can bet we will break attendance records, absolutely. I would like to call on ALL semiconductor IP companies to exhibit this year. IP is the center of the semiconductor design universe, DAC is the premier semiconductor design event, and San Francisco … Read More


Taming The Interconnect In Real World For SoCs

Taming The Interconnect In Real World For SoCs
by Pawan Fangaria on 12-13-2013 at 1:30 pm

Interconnect plays a significant role in the semiconductor design of a SoC; if not architected and handled well, it can lead to an overdesigned SoC impacting on its power, performance and area. Since a SoC generally contains multiple IPs requiring different data paths to satisfy varying latency and performance cycles, it has … Read More


How to Assure Quality of Power and SI Verification?

How to Assure Quality of Power and SI Verification?
by Pawan Fangaria on 12-08-2013 at 10:05 am

As power has become one of the most important criteria in semiconductor design today, I was wondering whether there is a standard set for the power verification for an overall chip. We do have formats evolved like CPF and UPF and there are tools available to check power and signal integrity (SI), however I don’t see a standard objective… Read More


What Makes A Designer’s Day? A Bottleneck Solved!

What Makes A Designer’s Day? A Bottleneck Solved!
by Pawan Fangaria on 12-04-2013 at 3:00 pm

In an environment of SoCs with tough targets of multiple functionalities, smallest size, lowest power and fastest performance to achieve within a limited design cycle window in order to meet the rigid time-to-market requirements, any day spent without success becomes very frustrating for a designer. Especially during tape-out… Read More


Cadence & ARM Optimize Complex SoC Performance

Cadence & ARM Optimize Complex SoC Performance
by Pawan Fangaria on 12-03-2013 at 3:00 pm

Now a day, a SoC can be highly complex, having 100s of IPs performing various functionalities along with multi-core CPUs on it. Managing power, performance and area of the overall semiconductor design in the SoC becomes an extremely challenging task. Even if the IPs and various design blocks are highly optimized within themselves,… Read More


Full Chip ESD Sign-off – Necessary

Full Chip ESD Sign-off – Necessary
by Pawan Fangaria on 11-13-2013 at 7:00 pm

As Moore’s law keeps going, semiconductor design density on a chip keeps increasing. The real concern today is that the shrinkage in technology node has rendered the small wire geometry and gate oxide thickness (although fine in all other perspectives) extremely vulnerable to ESD (Electrostatic Discharge) effects. More than… Read More


Semiconductor Fabrication Module Optimization

Semiconductor Fabrication Module Optimization
by Pawan Fangaria on 11-11-2013 at 9:00 am

The growing process integration complexity at each technology node has increased development time and cost, and this trend looks to continue. There is a looming risk of delivering unrepeatable critical unit processes (or process modules) that would require revisiting development and manufacturing requalification or in … Read More