A Robust Lint Methodology Ensures Faster Design Closure

A Robust Lint Methodology Ensures Faster Design Closure
by Pawan Fangaria on 06-03-2015 at 4:00 am

With the increase in SoC designs’ sizes and complexities, the verification continuum has grown larger to an extent that the strategies for design convergence need to be applied from the very beginning of the design flow. Often designers are stuck with never ending iterations between RTL, gate and transistor levels at different… Read More


A Key Partner in the Semiconductor Ecosystem

A Key Partner in the Semiconductor Ecosystem
by Pawan Fangaria on 05-19-2015 at 5:00 pm

Often we hear about isolated instances of excellence from various companies in the semiconductor industry which contribute significantly in building the overall ecosystem. While the individual excellence is essential, it’s rather more important how that excellence is utilized in a larger way by the industry to create a ‘value… Read More


Starvision Pro: Lattice Semiconductor’s Experience

Starvision Pro: Lattice Semiconductor’s Experience
by Paul McLellan on 04-09-2015 at 7:00 am

During SNUG I took the opportunity to chat to Choon-Hoe Yeoh of Lattice Semiconductor about how they use Concept Engineering’s Starvision Pro product. He is the senior director of EDA tools and methodologies there.

Lattice Semiconductor is a manufacturer of low-power, small-footprint, low-cost programmable logic devices.… Read More


Verifying the RTL Coming out of a High-Level Synthesis Tool

Verifying the RTL Coming out of a High-Level Synthesis Tool
by Daniel Payne on 03-30-2015 at 9:30 pm

With High-Level Synthesis (HLS) the first benefit that comes to my mind is reduced design time, because coding with C or SystemC is more efficient than low-level RTL code. What I’ve just learned is that there’s another benefit, a reduction in the amount of functional simulation required. One HLS customer was able … Read More


Expert Tool to Easily Debug RTL and Reuse in SoCs

Expert Tool to Easily Debug RTL and Reuse in SoCs
by Pawan Fangaria on 12-16-2014 at 7:00 pm

SoC design these days has become a complex and tricky phenomenon involving integration of multiple IPs and legacy RTL code which could be in different languages, sourced from various third parties across the globe. Understanding and reusing RTL code is imperative in SoC integration which needs capable tools that can accommodate… Read More


How to Optimize for Power at RTL

How to Optimize for Power at RTL
by Daniel Payne on 11-30-2014 at 7:00 pm

Last week I was traveling in Munich attending the MunEDA User Group meetingso I missed a live webinar on the topic of optimizing for power at RTL. I finally got caught up in my email this week and had time to view this 47 minute webinar, presented by Guillaume Boilletof Atrenta. He recommended using a combination of automatic, semi-automatic… Read More


HLS Tools Coming into Limelight!

HLS Tools Coming into Limelight!
by Pawan Fangaria on 11-20-2014 at 10:00 pm

For about a decade I am looking forward to seeing more of system level design and verification including high level synthesis (HLS), virtual prototyping, and system modeling etc. to come in the main stream of SoC design. Although the progress has been slow, I see it accelerating as more and more tools address the typical pain points… Read More


Complete SoC Debugging & Integration in a Single Cockpit

Complete SoC Debugging & Integration in a Single Cockpit
by Pawan Fangaria on 11-15-2014 at 10:00 am

These days it’s common to expect large digital designs, analog blocks, custom IPs, glue logic, interfaces and interconnects all developed separately, perhaps by different vendors / teams, but integrated together in a single environment forming an SoC. The SoC can have multiple clock domains and can work in multiple modes of … Read More


Improve Test Robustness & Coverage Early in Design

Improve Test Robustness & Coverage Early in Design
by Pawan Fangaria on 11-03-2014 at 5:00 pm

In a semiconductor design, keeping the design testable with high test coverage has always been a requirement. However with shrinking technology nodes and large, dense SoC designs and complex logic structures, while it has become mandatory to reach close to 100% test coverage, it’s extremely difficult to cope with the explosion… Read More


Noise & Reliability of FinFET Designs – Success Stories!

Noise & Reliability of FinFET Designs – Success Stories!
by Pawan Fangaria on 11-01-2014 at 7:00 am

I think by now there has been good level of discussion on FinFET technology at sub-20 nm process nodes and this is an answer to ultra dense, high performance, low power, and billion+ gate SoC designs within the same area. However, it comes with some of the key challenges with respect to power, noise and reliability of the design. A FinFET… Read More