It isn’t hard to understand the advantage of mesh networking (in wireless networks). Unlike star/tree configurations in which end-points connect to a nearby hub (such as phones connecting to a conventional wireless access point), in a mesh nodes can connect to nearest neighbors, which can connect to their nearest neighbors… Read More
Tag: reliability
Integrity, Reliability Shift Left with ICC
There is a nice serendipity in discovering that two companies I cover are working together. Good for them naturally but makes my job easier because I already have a good idea about the benefits of the partnership. Synopsys and ANSYS announced a collaboration at DAC 2017 for accelerating design optimization for HPS, mobile and automotive.… Read More
John Lee: Market Trends, Raising the Bar on Signoff
I talked to John Lee (GM of the ANSYS Semiconductor BU) recently about his views on market trends and the ANSYS big-picture theme for DAC 2018. He set the stage by saying he really liked Wally’s view on trends (see my blog on Wally’s keynote at U2U). John said these confirm what he is seeing – a trend to specialization, some around… Read More
Webinar: Thermal and Reliability for ADAS and Autonomy
OK, so maybe the picture here is a little over the top, but thermal and reliability considerations in automotive in general and in ADAS and autonomy in particular, are no joke. Overheating, thermal-induced EM and warping at the board-level, in the package or interposers, are concerns in any environment but especially when you’re… Read More
Stress and Aging
These failings aren’t just a cross we humans bear; they’re also a concern for chips, particularly in electrical over-stress (EOS) and aging of the circuitry. Such concerns are not new, but they are taking on new urgency given the high reliability and long lifetime expectations we have for safety-critical components in cars and… Read More
Webinar: Multiphysics Reliability Signoff for Next-Generation Automotive Electronics Systems
In case you missed the TSMC event, ANSYS and TSMC are going to reprise a very important topic – signing-off reliability for ADAS and semi-autonomous /autonomous systems. This topic hasn’t had a lot of media attention amid the glamor and glitz of what might be possible in driverless cars. But it now seems like the cold light of real … Read More
The Elephant in the Autonomous Car
I was driving recently on highway 87 (San Jose) and wanted to merge left. I checked my side-mirror, checked the blind-spot detector, saw no problems and started to move over – and quickly swerved back when a car shot by on my left. What went wrong? My blind-spot detection, a primary feature in ADAS (advanced driver assistance systems,… Read More
Webinar: High-Capacity Power Signoff Using Big Data
Want to know how NVIDIA signs off on power integrity and reliability on mega-chips? Read on.
PPA over-design has repercussions in increased product cost and potential missed schedules with no guarantee of product success. Advanced SoCs pack more functionality and performance resulting in higher power density, but traditional… Read More
Webinars: Bumper Pack of AMS Webinars from ANSYS
Power integrity and reliability are just as important for AMS designs as they are for digital designs. Ansys is offering a series of five webinars on this topic, under a heading they call ANSYS in ACTION, a bi-weekly demo series from ANSYS in which an application engineer shows you how simulation can address common applications.… Read More
Reliability Signoff for FinFET Designs
Ansys recently hosted a webinar on reliability signoff for FinFET-based designs, spanning thermal, EM, ESD, EMC and aging effects. I doubt you’re going to easily find a more comprehensive coverage of reliability impact and analysis solutions. If you care about reliability in FinFET designs, you might want to check out this webinar.… Read More