Accelerating SOC Development for Automobile Applications

Accelerating SOC Development for Automobile Applications
by Tom Simon on 03-11-2019 at 12:00 pm

No area of electronics is moving faster than automotive semiconductors. Everyone has been talking about the increasing electronics content of automobiles for decades. With Advanced Driver Assistance System (ADAS) and autonomous driving becoming a reality the pace has picked up even more. These new designs combine just about… Read More


Accelerating 5G Innovation and Reliability Through Simulation and Advanced FinFET Design

Accelerating 5G Innovation and Reliability Through Simulation and Advanced FinFET Design
by Camille Kokozaki on 02-14-2019 at 7:00 am

In an ANSYS seminar held at DesignCon 2019, Dr. Larry Williams, ANSYS Director of Technology, outlined how 5G design innovation can be accelerated through simulation. He posited that 5G will become a general-purpose technology that affects an entire economy, drastically alter societies and unleash a cascade of complementary… Read More


Mentor’s Busy ITC and Major Test Product Updates

Mentor’s Busy ITC and Major Test Product Updates
by Tom Simon on 10-31-2018 at 1:00 pm

In conjunction with the 2018 International Test Conference, Mentor has several interesting test announcements. They also have a busy round of technical activities, including a number of technical papers, presentations, tutorials and a poster from a major customer about using Mentor. I’d like to touch on the two product related… Read More


Mesh Networks, Redux

Mesh Networks, Redux
by Bernard Murphy on 09-27-2018 at 7:00 am

It isn’t hard to understand the advantage of mesh networking (in wireless networks). Unlike star/tree configurations in which end-points connect to a nearby hub (such as phones connecting to a conventional wireless access point), in a mesh nodes can connect to nearest neighbors, which can connect to their nearest neighbors… Read More


Integrity, Reliability Shift Left with ICC

Integrity, Reliability Shift Left with ICC
by Bernard Murphy on 06-26-2018 at 7:00 am

There is a nice serendipity in discovering that two companies I cover are working together. Good for them naturally but makes my job easier because I already have a good idea about the benefits of the partnership. Synopsys and ANSYS announced a collaboration at DAC 2017 for accelerating design optimization for HPS, mobile and automotive.… Read More


John Lee: Market Trends, Raising the Bar on Signoff

John Lee: Market Trends, Raising the Bar on Signoff
by Bernard Murphy on 06-07-2018 at 7:00 am

I talked to John Lee (GM of the ANSYS Semiconductor BU) recently about his views on market trends and the ANSYS big-picture theme for DAC 2018. He set the stage by saying he really liked Wally’s view on trends (see my blog on Wally’s keynote at U2U). John said these confirm what he is seeing – a trend to specialization, some around… Read More


Webinar: Thermal and Reliability for ADAS and Autonomy

Webinar: Thermal and Reliability for ADAS and Autonomy
by Bernard Murphy on 05-15-2018 at 7:00 am

OK, so maybe the picture here is a little over the top, but thermal and reliability considerations in automotive in general and in ADAS and autonomy in particular, are no joke. Overheating, thermal-induced EM and warping at the board-level, in the package or interposers, are concerns in any environment but especially when you’… Read More


Stress and Aging

Stress and Aging
by Bernard Murphy on 04-05-2018 at 12:00 pm

These failings aren’t just a cross we humans bear; they’re also a concern for chips, particularly in electrical over-stress (EOS) and aging of the circuitry. Such concerns are not new, but they are taking on new urgency given the high reliability and long lifetime expectations we have for safety-critical components in cars and… Read More


Webinar: Multiphysics Reliability Signoff for Next-Generation Automotive Electronics Systems

Webinar: Multiphysics Reliability Signoff for Next-Generation Automotive Electronics Systems
by Bernard Murphy on 02-08-2018 at 7:00 am

In case you missed the TSMC event, ANSYS and TSMC are going to reprise a very important topic – signing-off reliability for ADAS and semi-autonomous /autonomous systems. This topic hasn’t had a lot of media attention amid the glamor and glitz of what might be possible in driverless cars. But it now seems like the cold light of real … Read More


The Elephant in the Autonomous Car

The Elephant in the Autonomous Car
by Bernard Murphy on 11-21-2017 at 7:00 am

I was driving recently on highway 87 (San Jose) and wanted to merge left. I checked my side-mirror, checked the blind-spot detector, saw no problems and started to move over – and quickly swerved back when a car shot by on my left. What went wrong? My blind-spot detection, a primary feature in ADAS (advanced driver assistance systems,… Read More