Place & Route with FinFETs and Double Patterning

Place & Route with FinFETs and Double Patterning
by Paul McLellan on 09-29-2014 at 8:00 am

Place & route in the 16/14nm era requires a new approach since it is significantly more complex. Of course, every process generation is more complex than the one before and the designs are bigger. But modern processes have new problems. The two biggest changes are FinFETs and double patterning.

FinFETs, as I assume you know,… Read More


Mentor at TSMC OIP, 16nm, and 10nm

Mentor at TSMC OIP, 16nm, and 10nm
by Beth Martin on 09-26-2014 at 4:46 pm

On Tuesday, September 30, TSMC hosts another Open Innovation Platform Ecosystem forum at the San Jose Convention Center. Have you registered? This year includes 30 technical sessions from TSMC’s ecosystem partners, divided into three separate tracks. I’ll be hanging out in the EDA track, listening to various takes on 16nm FinFET… Read More


Coverage Driven Verification for Analog?

Coverage Driven Verification for Analog?
by Pawan Fangaria on 09-26-2014 at 1:00 am

We know there is a big divide between analog and digital design methodologies, level of automation, validation and verification processes, yet they cannot stay without each other because any complete system on a chip (SoC) demands them to be together. And therefore, there are different methodologies on the floor to combine analog… Read More


Transceiver Verification of a 20nm Altera FPGA Device

Transceiver Verification of a 20nm Altera FPGA Device
by Daniel Payne on 09-11-2014 at 6:00 pm

FPGA devices are a great way to drive silicon technology development because they contain both digital and analog IP, along with sophisticated IO cells. The highest performance IOs are transceivers, and Altera has recently designed the Arria 10 device family to include up to 96 transceivers, using a 20nm technology that can achieve… Read More


Managing Stress in 3D

Managing Stress in 3D
by Beth Martin on 09-02-2014 at 1:32 pm

A new publication on mechanical stress in integrated circuits, co-edited by Valeriy Sukharev, Principal Engineer for Calibre R&D at Mentor Graphics, has just been released by AIP Publishing. “Stress-Induced Phenomena and Reliability in 3D Microelectronics” includes 14 key papers from four international workshops … Read More


Improving Complex System Design

Improving Complex System Design
by Paul McLellan on 08-29-2014 at 7:01 am

Next week Mike Jensen of Mentor will present a webinar Improving Complex System Design Reliability and Robustness. The webinar will be presented live twice and presumably available for replay soon after, as is usually the case:

  • September 4th 6.00-6.45am pacific (9pm in Asia, 3pm in most of Europe)
  • September 4th 10.00-10.45am
Read More

Mentor: It’s All About Cars

Mentor: It’s All About Cars
by Paul McLellan on 08-25-2014 at 7:08 pm

Mentor’s results came out last week. They were good. Wally opened the call:Thanks. Once again results for Mentor Graphics in the quarter exceeded our guidance. Revenue of $260.2 million and non-GAAP earnings per share of $0.23, were ahead of our guidance of $250 million and $0.15 earnings per share. Strength in bookingsRead More


Analog Model Equivalence Checking Accelerates SoC Verification

Analog Model Equivalence Checking Accelerates SoC Verification
by Pawan Fangaria on 08-09-2014 at 7:30 pm

In the race to reduce verification time for ever growing sizes of SoCs, various techniques are being adopted at different levels in the design chain, functional verification being of utmost priority. In an analog-digital mixed design, which is the case with most of the SoCs, the Spice simulation of analog components is the limiting… Read More


Layout-aware Diagnosis

Layout-aware Diagnosis
by Paul McLellan on 08-08-2014 at 8:01 am

Traditional test methodologies have been based on the functional model, that is to say the netlist. The most well-known is probably the stuck-at model which grades a sequence of test vectors by whether they would have managed to notice the difference between a fully functional design and one where one of the signals was permanently… Read More


Pizza con Questa

Pizza con Questa
by Paul McLellan on 07-30-2014 at 11:01 am

Last week I went to a lunch and learn at Mentor about their Questa formal product given by Kurt Takara. Like everyone else these days, Questa is packaged as a number of Apps for doing different tasks. Formal verification is different from other EDA tools in that different approaches can be used for different sub-tasks. There are three… Read More