hip webinar automating integration workflow 800x100 (1)
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BEOL Mask Reduction Using Spacer-Defined Vias and Cuts

BEOL Mask Reduction Using Spacer-Defined Vias and Cuts
by Fred Chen on 12-06-2023 at 6:00 am

BEOL Mask Reduction Using Spacer Defined Vias and Cuts

In recent advanced nodes, via and cut patterning have constituted a larger and larger portion of the overall BEOL mask count. The advent of SALELE [1,2] caused mask count to increase for EUV as well, resulting in costs no longer being competitive with DUV down to 3nm [3]. Further development by TEL [4] has shown the possibility for… Read More


Predicting Stochastic Defectivity from Intel’s EUV Resist Electron Scattering Model

Predicting Stochastic Defectivity from Intel’s EUV Resist Electron Scattering Model
by Fred Chen on 11-22-2023 at 6:00 am

Predicting Stochastic Defectivity from Intel's EUV Resist Electron Scattering Model

The release and scattering of photoelectrons and secondary electrons in EUV resists has often been glossed over in most studies in EUV lithography, despite being a fundamental factor in the image formation. Fortunately, Intel has provided us with a laboriously simulated electron release and scattering model, using the GEANT4… Read More


China’s hoard of chip-making tools: national treasures or expensive spare parts?

China’s hoard of chip-making tools: national treasures or expensive spare parts?
by Craig Addison on 11-20-2023 at 10:00 am

Raiders of the Lost Ark warehouse photo courtesy Paramount Pictures

In the closing scene of Steven Spielberg’s Raiders of the Lost Ark (1981), the camera pulls back to reveal an enormous warehouse stacked with crates of artifacts hidden away by the US government. 

One could imagine a similar warehouse in China today. The crates would hold a different kind of treasure – semiconductor production … Read More


The Significance of Point Spread Functions with Stochastic Behavior in Electron-Beam Lithography

The Significance of Point Spread Functions with Stochastic Behavior in Electron-Beam Lithography
by Fred Chen on 10-31-2023 at 10:00 am

Electron Beam Lithography

Electron beam lithography is commercially used to directly write submicron patterns onto advanced node masks. With the advent of EUV masks and nanometer-scale NIL (nanoimprint lithography), multi-beam writers are now being used, compensating the ultralow throughput of a single high-resolution electron beam with the use… Read More


KLAC- OK quarter in ugly environment- Big China $ – Little Process $ – Legacy good

KLAC- OK quarter in ugly environment- Big China $ – Little Process $ – Legacy good
by Robert Maire on 10-29-2023 at 10:00 am

KLAC Tencor
  • KLA has an OK quarter in an ugly market- bouncing along bottom
  • Like Lam & ASML, China was huge at 43% represents more risk
  • 2/3 Foundry/logic, 1/3 memory – Process tools were weak
  • No change, stable , no visibility on recovery
Quarter and guide were good in continued ugly industry

As expected KLAC reported earnings at the … Read More


ASML- Longer Deeper Downcycle finally hits lithography – Flat 2024 – Weak Memory – Bottom?

ASML- Longer Deeper Downcycle finally hits lithography – Flat 2024 – Weak Memory – Bottom?
by Robert Maire on 10-20-2023 at 8:00 am

ASML Monopoly
  • ASML reports in-line QTR but future looks flat for 2024
  • Downcycle finally hits litho leader- ASML monopoly solid as ever
  • Memory remains bleak – New China sanctions unclear
  • Recovery timing is unclear but planning for an up 2025
In Line Quarter and year as expected

Overall revenues came in at Euro6.7B with EPS at Euro4.81, more… Read More


ASML- Absolutely Solid Monopoly in Lithography- Ignoring hysteria & stupidity

ASML- Absolutely Solid Monopoly in Lithography- Ignoring hysteria & stupidity
by Robert Maire on 10-17-2023 at 8:00 am

ASML Monopoly
  • This past weeks over-reaction to Canon echoes the Sculpta Scare
  • Nanoimprint has made huge strides but is still not at all competitive
  • Shows basic lack of understanding of technology by some pundits
  • Chip industry has been searching for alternatives that don’t exist
Much ado about nothing much…..

This past week we … Read More


SPIE- EUV & Photomask conference- Anticipating High NA- Mask Size Matters- China

SPIE- EUV & Photomask conference- Anticipating High NA- Mask Size Matters- China
by Robert Maire on 10-09-2023 at 6:00 am

Conference EUV Lithography

– SPIE EUV & Photomask conference well attended with great talks
– Chip industry focused on next gen High NA EUV & what it impacts
– Do big chips=big masks? Another Actinic tool?
– AI & chip tools, a game changer- China pre-empting more sanctions

The SPIE EUV & Photomask conference in Monterey
Read More

Extension of DUV Multipatterning Toward 3nm

Extension of DUV Multipatterning Toward 3nm
by Fred Chen on 10-02-2023 at 8:00 am

Extension of DUV Multipatterning Toward 3nm

China’s recent achievement of a 7nm-class foundry node using only DUV lithography [1] raises the question of how far DUV lithography can be extended by multipatterning. A recent publication at CSTIC 2023 indicates that Chinese groups are currently looking at extension of DUV-based multipatterning to 5nm, going so far… Read More


Stochastic Model for Acid Diffusion in DUV Chemically Amplified Resists

Stochastic Model for Acid Diffusion in DUV Chemically Amplified Resists
by Fred Chen on 09-11-2023 at 8:00 am

Stochastic Model for Acid Diffusion in DUV Chemically Amplified Resists 1

Recent articles have focused much effort on studying the stochastic behavior of secondary electron exposure of EUV resists [1-4]. Here, we consider the implications of extending similar treatments to DUV lithography.

Basic Model Setup

As before, the model uses pixel-by-pixel calculations of absorbed photon dose, followed… Read More