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DAC Panel – Artificial Intelligence Comes to CAD: Where’s the Data?

DAC Panel – Artificial Intelligence Comes to CAD: Where’s the Data?
by Tom Simon on 07-30-2020 at 10:00 am

Which problems are ripe for AIML

Artificial Intelligence (AI) and Machine Learning (ML) are becoming more and more commonplace in our world. We have Siri, Alexa and Google Assistant that understand our voice commands. Vision systems that recognize objects are used for facial recognition, autonomous driving, medical, geographical and many other applications.… Read More


Hierarchical CDC analysis is possible, with the right tools

Hierarchical CDC analysis is possible, with the right tools
by Bernard Murphy on 07-14-2020 at 6:00 am

Design complexity demands hierarchical CDC

Back in my Atrenta days (before mid-2015), we were already running into a lot of very large SoC-level designs – a billion gates or more. At those sizes, full-chip verification of any kind becomes extremely challenging. Memory demand and run-times explode, and verification costs explode also since these runs require access to … Read More


What’s New in Verdi? Faster Debug

What’s New in Verdi? Faster Debug
by Bernard Murphy on 07-02-2020 at 6:00 am

Verdi Unified Debug

Want fast debug? Synopsys recently hosted a Webinar to show off the latest and greatest improvements to Verdi® in performance, memory demand and multi-tasking, among other areas.

Performance improvements
Taruna Reddy (PMM) and Allen Hsieh (Staff apps) presented features of the latest version, released in March – Taruna started… Read More


Design Technology Co-Optimization (DTCO) for sub-5nm Process Nodes

Design Technology Co-Optimization (DTCO) for sub-5nm Process Nodes
by Tom Dillinger on 06-23-2020 at 6:00 am

scaled metal resistance

Summary
Design Technology Co-Optimization (DTCO) analysis was pursued for library cell PPA estimates for gate-all-around (GAA) devices and new metallurgy options.  The cell design and process recommendations are a bit surprising.

Introduction
During the “golden years” of silicon technology evolution that applied Dennard… Read More


Webinar: Optimize SoC Glitch Power with Accurate Analysis from RTL to Signoff

Webinar: Optimize SoC Glitch Power with Accurate Analysis from RTL to Signoff
by Mike Gianfagna on 06-16-2020 at 6:00 am

Screen Shot 2020 06 15 at 6.59.34 PM

I had the opportunity to preview an upcoming webinar from Synopsys on SoC Glitch Power – what it is and how to reduce it. There is some eye-opening information in this webinar. Glitch power is a bigger problem than you may think and Synopsys has some excellent strategies to help reduce the problem. The webinar is available via replay… Read More


The Problem with Reset Domain Crossings

The Problem with Reset Domain Crossings
by Bernard Murphy on 05-14-2020 at 6:00 am

Reset button

Design complexities in reset, like everything else in big SoC designs, has become incredibly complex, for all sorts of reasons. Long, long ago reset was something you just did once, when you turned the power on. Turn on, then hold reset for some amount of time until everything is in a known starting state, and off you go. Nice and simple.… Read More


What’s New in CDC Analysis?

What’s New in CDC Analysis?
by Bernard Murphy on 04-06-2020 at 6:00 am

Validating assumptions in CDC constraints

Synopsys just released a white paper, a backgrounder on CDC. You’ve read enough of what I’ve written on this topic that I don’t need to re-tread that path. However, this is tech so there’s always something new to talk about. This time I’ll cover a Synopsys survey update on numbers of clock domains in designs, also an update on ways to… Read More


SpyGlass Gets its VC

SpyGlass Gets its VC
by Bernard Murphy on 03-26-2020 at 6:00 am

VC SpyGlass Lint

It’s a matter of pride to me and many others from Atrenta days that the brand we built in SpyGlass has been so enduring. It seems that pretty much anyone who thinks of static RTL checking thinks SpyGlass. Even after Synopsys acquired Atrenta, they kept the name as-is, I’m sure because the brand recognition was so valuable.

Even good… Read More


Prevent and Eliminate IR Drop and Power Integrity Issues Using RedHawk Analysis Fusion

Prevent and Eliminate IR Drop and Power Integrity Issues Using RedHawk Analysis Fusion
by Mike Gianfagna on 03-24-2020 at 10:00 am

Screen Shot 2020 03 14 at 5.36.37 PM

I had the opportunity to preview an upcoming SemiWiki webinar on IR drop and power integrity. These topics, all by themselves, have real stopping power. Almost everyone I speak with has a story to tell about these issues in a recent chip design project. When you combine hot topics like this with a presentation that details the collaboration… Read More


Achieving Design Robustness in Signoff for Advanced Node Digital Designs

Achieving Design Robustness in Signoff for Advanced Node Digital Designs
by Mike Gianfagna on 03-09-2020 at 10:00 am

Synopsys SemiWiki STARRC Webinar 1

I had the opportunity to preview an upcoming webinar on SemiWiki that deals with design robustness for signoff regarding advanced node digital designs (think single-digit nanometers). “Design robustness” is a key term – it refers to high quality, high yielding SoCs that come up quickly and reliably in the target system. We all… Read More