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The Need for OASIS in Post-layout IC Databases

The Need for OASIS in Post-layout IC Databases
by Daniel Payne on 08-31-2012 at 7:20 pm

OASIS is a hierarchical IC file format used for IC designs that is gradually replacing GDS II throughout the mask data stages. The compelling reason for using OASIS has always been the reduction of file size, and speed up of processing times through the use of hierarchy and fewer translation steps.

At the 45nm node an actual M1 layer… Read More


A Brief History of Mentor Graphics

A Brief History of Mentor Graphics
by Beth Martin on 08-20-2012 at 11:00 pm

In 1981, Pac-Man was sweeping the nation, the first space shuttle launched, and a small group of engineers in Oregon started not only a new company (Mentor Graphics), but an entirely new industry, electronic design automation (EDA).


Mentor founders Tom Bruggere, Gerry Langeler, and Dave Moffenbeier left Tektronix with a great… Read More


While you’re reading the SoC manual

While you’re reading the SoC manual
by Don Dingee on 08-09-2012 at 8:30 pm

There was a day, not too long ago, when a software developer could be intimate with a processor through understanding its register set. Before coding, developers would reach for a manual, digging through pages and pages of 1s and 0s with defined functions to find how to gain control over the processor and its capability. One bit set… Read More


It Takes a Village: Mentor and ARM Team Up on Test

It Takes a Village: Mentor and ARM Team Up on Test
by Beth Martin on 07-18-2012 at 5:01 pm

Benjamin Franklin, “I didn’t fail the test, I just found 100 ways to do it wrong.” I was reminded of this line during a joint Mentor-ARM seminar yesterday about testing ARM cores and memories. The complexity of testing modern SoC designs at advanced nodes, with multiple integrated ARM cores and other IP, opens up plenty of room for… Read More


How Do You Extract 3D IC Structures?

How Do You Extract 3D IC Structures?
by Daniel Payne on 07-18-2012 at 2:01 pm

The press has been buzzing about 3D everything for the past few years, so when it comes to IC design it’s a fair question to ask how would you actually extract 3D IC structures for use by analysis tools like a circuit simulator. I read a white paper by Christen Decoin and Vassilis Kourkoulos of Mentor Graphics this week and became… Read More


Design-to-Silicon Platform Workshops!

Design-to-Silicon Platform Workshops!
by Daniel Nenni on 07-17-2012 at 7:30 pm

Have you seen the latest design rule manuals? At 28nm and 20nm design sign-off is no longer just DRC and LVS. These basic components of physical verification are being augmented by an expansive set of yield analysis and critical feature identification capabilities, as well as layout enhancements, printability, and performance… Read More


Scoreboards and Results Predictors in UVM

Scoreboards and Results Predictors in UVM
by Daniel Nenni on 07-15-2012 at 10:56 am

If verification is the art of determining that your design works correctly under all specified conditions, then it is imperative that we are able to create an environment that can tell you if this is truly the case.

Scoreboards are verification components that determine that the DUT is working correctly, including ensuring that… Read More


Testing ARM Cores – Mentor and ARM Lunch Seminar

Testing ARM Cores – Mentor and ARM Lunch Seminar
by Beth Martin on 07-08-2012 at 8:29 pm

If you are involved in testing memory or logic of ARM-based designs, you’ll want to attend this free seminar on July 17, 2012 in Santa Clara. Mentor Graphics and ARM have a long standing partnership, and have optimized the Mentor test products (a.k.a Tessent) for the ARM processors and memory IP.

The lunch seminar runs from 10:30-1:00… Read More


IC Test Sessions at SEMICON West 2012

IC Test Sessions at SEMICON West 2012
by Beth Martin on 07-02-2012 at 1:43 pm

SEMICON West is coming up this July 10-12 at the Moscone Center in San Francisco. It covers a broad swath of the microelectronics supply chain, but I was particularly interested in the test sessions. Here are two that I recommend.

The Value of Test for Semiconductor Yield Learning” on Tuesday, July 10, at 1:30p. The… Read More