Next week Mike Jensen of Mentor will present a webinar Improving Complex System Design Reliability and Robustness. The webinar will be presented live twice and presumably available for replay soon after, as is usually the case:
Planar CMOS processes have been offered for decades now, and all the way down through the 28nm node it has been riding the benefits of Moore’s Law. A few years back we started hearing from Intel about TriGate (aka FinFET) starting at the 22nm node as a way to use a more 3D processing approach for transistors instead of planar CMOS.… Read More
Verification has been going through a lot of changes in the last couple of years. Three technologies that used to be largely contained in their own silos have come together: simulation, emulation and virtual-platforms.
Until recently, the workhorse verification tool was simulation. Emulation had its place but limits on capacity… Read More
One of the challenges in bringing a design into production is getting a quote that includes all the various stages of the process. The quote cycle typically takes a couple of weeks. It is also pretty wasteful. A typical design might be quoted by 3 manufacturers and so 2 out of 3 quotes are wasted expense because the design is lost to a … Read More
The last graphics chip that I worked on at Intel was functionally simulated with only a tiny display size of 16×16 pixels, because that size allowed a complete regression test to be simulated overnight. Our team designed three major IP blocks: Display Processor, Graphics Processor and Bus Interface Unit. We wanted to also… Read More
Test engineers are often the unsung heroes in the semiconductor world, because they have the tough job of deciding if each IC is good or bad, while taking the least amount of time on a tester and ensuring that the tests are actually finding and uncovering all manufacturing and process variation defects. Simple stuck-at fault models… Read More
Single Event Effects (SEE) are important because we depend upon our consumer, industrial and aerospace products to work reliably. Protons, electrons, neutrons, or alpha particles may perturb the MOS or bipolar device operation in either a destructive or non-destructive fashion. Galactic cosmic rays are one source of these… Read More
Do you know what a SEE is? It stands for single event upset. We live on a radioactive planet which is also bombarded with cosmic rays, so particles are bombarding our chips. The materials used in packaging also can create particles that cause problems, even the solder. Reliability and aging has been an area that has not been at the forefront… Read More
Digital designers have used logic optimization and logic synthesis for decades as a means to produce more optimal designs with EDA tools. On the analog and transistor-level side of design the efforts to automatically optimize for speed or power have generally been limited to circuits with only a handful of transistors. These … Read More
Learning an HDL language or an HDL simulator are two different things, so I wanted to see what was available for learning a vendor-specific HDL simulator. I’ve already taught Verilog as an instructor using both ModelSim and Active-HDL simulators, however we only used a handful of commands in the class and labs in order to … Read More
