NoC resilience protects end-to-end

NoC resilience protects end-to-end
by Don Dingee on 10-13-2014 at 4:00 pm

Protecting memory with ECC but leaving the rest of an SoC uncovered is like having a guard dog chained up in the back corner of your yard. If the problem happens to be in that particular spot, it’ll be dealt with, otherwise there will be a lot of barking but little actual protection.

Similarly, adding a safety-capable processor like… Read More


Safer SoCs for safer driving

Safer SoCs for safer driving
by Don Dingee on 09-14-2014 at 4:00 pm

Flip on the TV, and a car commercial is bound to pop up shortly touting one of two technological aspects. One is center stack integration of smartphone-style applications. The other is advanced driver assistance systems (ADAS) featuring cameras, radar, and other sensors helping cars … Read More


Ceaseless Field Test for Safety Critical Devices

Ceaseless Field Test for Safety Critical Devices
by Pawan Fangaria on 06-03-2014 at 3:00 am

While focus of the semiconductor industry has shifted to DACin this week and unfortunately I couldn’t attend due to some of my management exams, in my spare time I was browsing through some of the webpages of Cadenceto check their new offerings (although they have a great list of items to showcase at DAC) and to my pleasure I came across… Read More


Dassault’s Simulation Lifecycle Management

Dassault’s Simulation Lifecycle Management
by Paul McLellan on 09-21-2013 at 4:29 pm

The first thing to realize about Dassault’s Simulation Lifecycle Management platform is that in the non-IC world where Dassault primarily operates, simulation doesn’t just mean functional verification or running Spice. It is anything during the design that produces analytical data. All of that data is important… Read More


Increasing Automotive Semiconductor Test Quality

Increasing Automotive Semiconductor Test Quality
by glforte on 06-17-2013 at 4:45 pm

The growing amount of electronics within today’s automobiles is driving very high quality and reliability requirements to a widening range of semiconductor devices. At the same time, traditional fault models are becoming less effective at achieving desired silicon quality levels. Improvements in test solutions are needed… Read More


10 years, 100,000 miles, or <1 DPM

10 years, 100,000 miles, or <1 DPM
by Don Dingee on 05-30-2013 at 10:00 pm

Auto makers have historically been accused of things like planned obsolescence – redesigning parts to make repairs painfully or even prohibitively expensive – and the “warranty time-bomb”, where major systems seem to fail about a week after the warranty expires. Optimists would chalk both those up to relentless innovation,… Read More