Dassault’s Simulation Lifecycle Management

Dassault’s Simulation Lifecycle Management
by Paul McLellan on 09-21-2013 at 4:29 pm

The first thing to realize about Dassault’s Simulation Lifecycle Management platform is that in the non-IC world where Dassault primarily operates, simulation doesn’t just mean functional verification or running Spice. It is anything during the design that produces analytical data. All of that data is important… Read More


Increasing Automotive Semiconductor Test Quality

Increasing Automotive Semiconductor Test Quality
by glforte on 06-17-2013 at 4:45 pm

The growing amount of electronics within today’s automobiles is driving very high quality and reliability requirements to a widening range of semiconductor devices. At the same time, traditional fault models are becoming less effective at achieving desired silicon quality levels. Improvements in test solutions are needed… Read More


10 years, 100,000 miles, or <1 DPM

10 years, 100,000 miles, or <1 DPM
by Don Dingee on 05-30-2013 at 10:00 pm

Auto makers have historically been accused of things like planned obsolescence – redesigning parts to make repairs painfully or even prohibitively expensive – and the “warranty time-bomb”, where major systems seem to fail about a week after the warranty expires. Optimists would chalk both those up to relentless innovation,… Read More