Every year certain technology themes appear, like at ITC this year a big theme was how to reduce the cost of SoC testing. I spoke with Rob Knoth of Cadence by phone to hear more about this cost of test theme. Rob gave me an example of an SoC that takes 27 seconds on a tester, so at $0.04 per second in test costs amounts to $1.08 per part. If you… Read More
As a 30+ year semiconductor veteran I can tell you with 100% certainty that start-ups are the lifeblood of EDA. The mantra is “Innovate or Die!” and that is exactly what Defacto is doing. After more than 10 years of innovating in Design for Test at RTL, Defacto is now offering a complete EDA solution based on generic EDA… Read More
In the early days of IC design there were arguments against using any extra transistors or gates for testability purposes, because that would be adding extra silicon area which in turn would drive up the costs of the chip and product. Today we are older and wiser, realizing that there are product pricing benefits to quickly test each… Read More
In early 2000s, semiconductor design at RTL level was gaining momentum. The idea was to process more design steps such as insertion of test and other design structures upfront at the RTL level. The design optimization and verification were to be done at the RTL level to reduce long iterations through gate level design because changes… Read More
When the topic of hardware emulation comes up, thoughts of big iron customarily come to mind. However, hardware emulation has evolved significantly and now there are other important traits that distinguish the offerings in this area. For a very long period of time emulators provided primarily a method to accelerate gate level… Read More
It requires lateral thinking in bringing new innovation into conventional solutions to age-old hard problems. While the core logic design has evolved adding multiple functionalities onto a chip, now called SoC, the structural composition of DFT (Design for Testability) has remained more or less same based on XOR-based compression… Read More
Design sizes and complexities have grown exponentially (it’s a Law!), and consequentially the task of silicon test has become proportionally more expensive. The cost of testing a device is proportional to the amount of test data that is applied, and therefore the time it takes, which in turn is proportional to both design size … Read More
Although I knew about Crossfire’s capabilities for signing off quality of an IP before its integration into an SoC, there was much more to learn about this tool when I visited Fractal Technologies booth during this DAC. The complexity handled by this tool to qualify any type of IP for its integration into an SoC can be imagined by the… Read More
Every SoC project that I know of wants to finish on time, under budget, and maximize profits per device. When I first started out doing DRAM design I learned that we could maximize profit by doing shrinks of existing designs, move from ceramic to plastic packages, and reduce the amount of time spent on a tester. Today, the economic … Read More
In the first part of this article, I talked about some of the key business aspects along with some technical aspects like system performance, functionality, and IP integration that drive the architecture of an SoC for its best optimization and realization in an economic sense. In this part, let’s dive into some more aspects that… Read More
