IROC Technologies CEO on Semiconductor Reliability

IROC Technologies CEO on Semiconductor Reliability
by Daniel Nenni on 05-26-2013 at 8:10 pm

One of the best things about being part of SemiWiki is the exposure to new technologies and the people behind them. SemiWiki now works with more than 35 companies and I get to spend time with each and every one of them. Much like I do, IROC Technologies works closely with the foundries and the top semiconductor companies so it was a pleasure… Read More


IJTAG for IP Test: a free seminar

IJTAG for IP Test: a free seminar
by Beth Martin on 03-14-2013 at 1:53 pm

What: Better IP Test with IJTAG
When: 26 March, 2013, 10:30am-1:30pm
Where: Mentor Graphics, 46871 Bayside Parkway, Fremont, CA 94538


If you are involved in IC test*, you’ve probably heard about the IEEE P1687 standard, called IJTAG for ‘internal’ JTAG. IJTAG defines a standard for embedded IP that includes simple… Read More


The Total ARM Platform!

The Total ARM Platform!
by Daniel Nenni on 07-24-2012 at 7:30 pm

In the embedded world that drives much of today’s ASIC innovation, there is no bigger name than ARM. Not to enter the ARM vs. Intel fray, but it’s no exaggeration to say that ARM’s impact on SoCs is as great as Intel’s on the PC. Few cutting edge SoCs are coming to market that do not include some sort of embedded… Read More


It Takes a Village: Mentor and ARM Team Up on Test

It Takes a Village: Mentor and ARM Team Up on Test
by Beth Martin on 07-18-2012 at 5:01 pm

Benjamin Franklin, “I didn’t fail the test, I just found 100 ways to do it wrong.” I was reminded of this line during a joint Mentor-ARM seminar yesterday about testing ARM cores and memories. The complexity of testing modern SoC designs at advanced nodes, with multiple integrated ARM cores and other IP, opens up plenty of room for… Read More


Testing ARM Cores – Mentor and ARM Lunch Seminar

Testing ARM Cores – Mentor and ARM Lunch Seminar
by Beth Martin on 07-08-2012 at 8:29 pm

If you are involved in testing memory or logic of ARM-based designs, you’ll want to attend this free seminar on July 17, 2012 in Santa Clara. Mentor Graphics and ARM have a long standing partnership, and have optimized the Mentor test products (a.k.a Tessent) for the ARM processors and memory IP.

The lunch seminar runs from 10:30-1:00… Read More


3D-IC Testing – A 3D perspective to SoC

3D-IC Testing – A 3D perspective to SoC
by Pawan Fangaria on 03-21-2012 at 9:30 am

In my last article I talked about the physical design aspect of 3D-IC. Now looking at its verification aspect, it spans through a wide spectrum of test at hardware as well as software level. The verification challenge goes much beyond that of a SoC which is at a single plane. Even a typical SoC that comprises of a processor core, memory… Read More


Design for test at RTL

Design for test at RTL
by Paul McLellan on 07-10-2011 at 3:09 pm

Design for test (DFT) imposes various restrictions on the design so that the test automation tools (automatic test pattern approaches such as scan, as well as built-in self-test approaches) will subsequently be able to generate the test program. For example, different test approaches impose constraints on clock generation… Read More