In the early days of Atrenta I met with Ralph Marlett, a distinguished test expert with many years of experience at Zuken and Recal Redac. He talked me into believing we could do meaningful static analysis for DFT-friendliness at RTL. His work with us really opened my eyes to the challenges that test groups face in integrating their… Read More
One of the most significant and oft repeated trends in EDA is the use of information from layout to help drive other parts of the design flow. This has happened with simulation and synthesis among other things. Of course, we think of test as a physical operation, but test pattern generation and sorting have been netlist based operations.… Read More
You may have seen a recent announcement from Mentor, a Siemens business, regarding the use of their Tessent DFT software by Ambarella for automotive applications. The announcement is a good example of how Mentor works with their customers to assure design success. On the surface the announcement comes across as a nice block and… Read More
I’ve talked before about how Defacto provides a platform for scripted RTL assembly. Kind of a rethink of the IP-XACT concept but without need to get into XML (it works directly with SV), and with a more relaxed approach in which you decide what you want to automate and how you want to script it.
They’re hosting a webinar on May 28th 10-11am… Read More
There is an adage that says that quality is not something that can be slapped on at the end of the design or manufacturing process. Ensuring quality requires careful thought throughout development and production. Arguably this adage is more applicable to the topic of Design for Test (DFT) than almost any other area of IC development… Read More
Hierarchy is nearly universally used in the SoC design process to help manage complexity. Dealing with flat logical or physical designs proved unworkable decades ago. However, there were a few places in the flow where flat tools continued to be used. Mentor lead the pack in the years around 1999 in helping the industry move from … Read More
Test for the Autonomous Age
The seminar will focus on three key test challenges IC vendors face as they try to make the promises of the autonomous age a reality.
- Implementing DFT on the very large designs and new compute architectures that are required for efficient AI and machine learning
- Achieving high test quality and
It is pretty common for physical layout to work from a flattened hierarchy for blocks or even full chips, even though the front-end design starts with a hierarchical representation. This was not always the case. Way back when, the physical layout matched the logical hierarchy during the design process. Of course, this led to all… Read More
We have entered the age of AI specific processors, where specialized silicon is being produced to tackle the compute needs of AI. Whether they use GPUs, embedded programmable logic or specialized CPUs, many AI chips are based on parallel processing. This makes sense because of the parallel nature of AI computing. As a result, in… Read More
In the semiconductor world we have divided our engineering talent up into many adjacent disciplines and each comes with their own job titles: Design engineers, Verification engineers, DFT engineers, Test engineers. When first silicon becomes available then everyone on the team, and especially management all have a few big … Read More