Webinar: NVIDIA Talks High Quality Metrics in Power Integrity Signoff

Webinar: NVIDIA Talks High Quality Metrics in Power Integrity Signoff
by Bernard Murphy on 11-09-2018 at 12:00 pm

There’s a familiar saying that you can’t improve what you can’t measure. Taking that one step further, the more improvement you want, the more accurately you have to measure. This become pretty important when you’re building huge designs in advanced technologies. Margins are a lot tighter all round and use-cases are massively… Read More


ANSYS at DAC

ANSYS at DAC
by Bernard Murphy on 06-21-2018 at 7:00 am

I’m not going to be at DAC this year because I scheduled a fishing trip at the end of June, assuming the show would stay true to form as an early/mid-June event. Still, having to endure salmon and halibut fishing in Alaska rather than slogging around Moscone Center, I can’t pretend to be too disappointed; I’ll be thinking of you all 😎.… Read More


John Lee: Market Trends, Raising the Bar on Signoff

John Lee: Market Trends, Raising the Bar on Signoff
by Bernard Murphy on 06-07-2018 at 7:00 am

I talked to John Lee (GM of the ANSYS Semiconductor BU) recently about his views on market trends and the ANSYS big-picture theme for DAC 2018. He set the stage by saying he really liked Wally’s view on trends (see my blog on Wally’s keynote at U2U). John said these confirm what he is seeing – a trend to specialization, some around… Read More


Big Data Analytics and Power Signoff at NVIDIA

Big Data Analytics and Power Signoff at NVIDIA
by Bernard Murphy on 11-23-2017 at 7:00 am

While it’s interesting to hear a tool-vendor’s point of view on the capabilities of their product, it’s always more compelling to hear a customer/user point of view, especially when that customer is NVIDIA, a company known for making monster chips.


A quick recap on the concept. At 7nm, operating voltages are getting much closer… Read More


Webinar: High-Capacity Power Signoff Using Big Data

Webinar: High-Capacity Power Signoff Using Big Data
by Bernard Murphy on 11-07-2017 at 7:00 am

Want to know how NVIDIA signs off on power integrity and reliability on mega-chips? Read on.

PPA over-design has repercussions in increased product cost and potential missed schedules with no guarantee of product success. Advanced SoCs pack more functionality and performance resulting in higher power density, but traditional… Read More


Big Data and Power Integrity: Drilling Down

Big Data and Power Integrity: Drilling Down
by Bernard Murphy on 08-21-2017 at 7:00 am

I’ve written before about how Ansys applies big data analytics and elastic compute in support of power integrity and other types of analysis. A good example of the need follows this reasoning: Advanced designs today require advanced semiconductor processes – 16nm and below. Designs at these processes run at low voltages, much… Read More


Webinar: Ansys on Multi-Physics PDN Optimization for 16/7nm

Webinar: Ansys on Multi-Physics PDN Optimization for 16/7nm
by Bernard Murphy on 07-22-2017 at 12:00 pm

On the off-chance you missed my previous pieces on this topic, at these dimensions conventional margin-based analysis becomes unreasonably pessimistic and it is necessary to analyze multiple dimensions together. People who build aircraft engines, turbines and other complex systems have known this for quite a long time. You… Read More


Cadence Explores Smarter Verification

Cadence Explores Smarter Verification
by Bernard Murphy on 07-10-2017 at 7:00 am

Verification as an effectively unbounded problem will always stir debate on ways to improve. A natural response is to put heavy emphasis on making existing methods faster and more seamless. That’s certainly part of continuous improvement but sometimes we also need to step back and ask the bigger questions – what is sufficient … Read More


Visual Quality

Visual Quality
by Bernard Murphy on 06-12-2017 at 7:00 am

A few years ago, I started looking at data visualization methods as a way to make sense of large quantities of complex data. This is a technique that has become very popular in big data analytics where it is effectively impossible to see patterns in data in any other way. There are vast numbers of different types of diagram – treemap,… Read More


Margin Call

Margin Call
by Bernard Murphy on 06-04-2017 at 7:00 am

A year ago, I wrote about Ansys’ intro of Big Data methods into the world of power integrity analysis. The motivation behind this advance was introduced in another blog, questioning how far margin-based approaches to complex multi-dimensional analyses could go. An accurate analysis of power integrity in a complex chip should… Read More