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How to reduce routing congestion in large Application Processor SoC?

How to reduce routing congestion in large Application Processor SoC?
by Eric Esteve on 07-14-2013 at 10:22 am

Application Processor SoC integrates more and more functions, generation after generation, challenging performance, cost, power efficiency, reliability, and time-to-market. But the maximum die size can’t increase, at least because of the constraints linked with wafer production, manufacturability, yield and finally… Read More


Interview with Arasan

Interview with Arasan
by Daniel Nenni on 07-12-2013 at 7:00 pm


Recently I had a chance to chat with Arasan Ganesan, CEO at Arasan Chip Systems in San Jose, CA. Arasan Chip Systems has provided Silicon interface IP and supporting hardware and software to the semiconductor industry for more than 15 years. The headquarters are in San Jose and engineering offices in Bangalore and Tuticorin, India.… Read More


Testing an IC Sandwich

Testing an IC Sandwich
by Beth Martin on 07-12-2013 at 3:10 pm

At a lovely, but chilly, 3DIncites awards breakfast during SEMICON West, I saw Mentor Graphics win in two of five categories (Calibre 3DSTACK was the other winner). Afterwards, I talked to Steve Pateras, the product marketing director of Mentor’s test solutions about Tessent Memory BIST, which was one of the winners. I asked Pateras… Read More


Aldec Verifies Compatibility of Northwest Logic’s PCI Express Cores with HES-7™ SoC/ASIC Prototyping Platform

Aldec Verifies Compatibility of Northwest Logic’s PCI Express Cores with HES-7™ SoC/ASIC Prototyping Platform
by Daniel Nenni on 07-12-2013 at 12:50 am

Henderson, Nevada – July 11, 2013 –Aldec, Inc., a pioneer in mixed HDL language simulation and hardware-assisted verification solutions, today announced that engineers incorporating high-speed PCI Express data transmission into their SoC and ASIC designs can accelerate their time-to-market utilizing Northwest LogicRead More


Data Centers accounts for 2 to 3% of WW Energy Consumption!

Data Centers accounts for 2 to 3% of WW Energy Consumption!
by Eric Esteve on 07-11-2013 at 8:19 am

Do you think this figure will go down? Considering the massive move to Mobile equipment, pushing to de-localize your storage medium to instead use the cloud capabilities, and looking at the huge number of people buying smartphone and tablet in emerging countries, no doubt that Data Center related energy consumption is expected… Read More


The Semiconductor IDM Business Model is Dead!

The Semiconductor IDM Business Model is Dead!
by Daniel Nenni on 07-10-2013 at 7:00 pm


While this was not specifically stated, it was certainly implied during the sessions I attended at SEMICON West this week: The traditional semiconductor business model (IDM) is coming to an end. Starting with the keynote: Foundry-driven Innovation in the Mobility Era,cost was the common theme in any discussion involving mobile… Read More


Analysis of HLS Results Made Easier

Analysis of HLS Results Made Easier
by Randy Smith on 07-10-2013 at 4:30 pm

In a recent article I discussed how easy it was to debug SystemC source code as shown in a video published on YouTube by Forte Design Systems. I also commented on the usefulness of the well-produced Forte video series. Today, I am reviewing another video in that series on analyzing high-level synthesis (HLS) results.

Cynthesizer… Read More


A Goldmine of Tester Data

A Goldmine of Tester Data
by Beth Martin on 07-10-2013 at 2:06 pm

Yesterday at SEMICON West I attended an interesting talk about how to use the masses of die test data to improve silicon yield. The speaker was Dr. Martin Keim, from Mentor Graphics.


First of all, he pointed out that with advanced process nodes (45nm, 32nm, and 28nm), and new technologies like FinFETs, we get design-sensitive defects.… Read More


Best Practices for Using DRC, LVS and Parasitic Extraction – on YouTube

Best Practices for Using DRC, LVS and Parasitic Extraction – on YouTube
by Daniel Payne on 07-10-2013 at 1:21 pm

EDA companies produce a wealth of content to help IC engineers get the best out of their tools through several means:

  • Reference Manuals
  • User Guides
  • Tutorials
  • Workshops
  • Seminars
  • Training Classes
  • Phone Support
  • AE visits
Read More

Towards the 0 DPM Test Goal

Towards the 0 DPM Test Goal
by Paul McLellan on 07-10-2013 at 10:43 am

At Semicon yesterday I attended Mentor’s presentation on improving test standards. Joe Sawicki was meant to present but he was unable to get a flight due to the ongoing disruption at SFO after last weekend’s crash. I just flew in myself and it is odd to see the carcase of that 777 just beside the runway we landed on.

The … Read More