Defect-Based Testing

Munich, Germany

Semiconductor and integrated circuit developments continue to proceed at an incredible pace. For example, today's application-specific ICs and microprocessors can contain upwards of 100 million transistors. Traditional testing relies on …

Infineon’s GaN Roadshow

Infineon Technologies 198 Champion Court, San Jose, CA, United States

About Event Join us at the Infineon GaN Roadshow stop in San Jose to experience the future of power! This one-day symposium will dive deep into Infineon's Gallium Nitride power …

Webinar: Tackling the Challenges of Functional Safety and Cybersecurity – Virtual Hands-on Workshop

Online

This is a hands-on workshop where the participants will get an opportunity to work with Ansys Medini and perform safety analysis through the Ansys virtual lab. TIME: November 19, 2024 10AM IST to 5PM IST Venue: Virtual Overview Ansys medini analyze is a model-based, integrated tool supporting safety analysis for safety-critical electrical and electronic (E/E) …