Defect-Based Testing

Munich, Germany

Semiconductor and integrated circuit developments continue to proceed at an incredible pace. For example, today's application-specific ICs and microprocessors can contain upwards of 100 million transistors. Traditional testing relies on the stuck-at-fault (SAF) to model defect behavior. Unfortunately, the SAF model is a poor model for defects. Other models and strategies are required to catch …

Webinar: Accelerating Complex RF Filter Design With AI-Powered Optimization

Online

Join us for this webinar to explore how Ansys SynMatrix, powered by AI-driven automation and HFSS integration, is transforming RF filter design by streamlining workflows, optimizing performance, and accelerating time-to-market. TIME: November 19, 2024 8am PST Venue: Virtual Overview RF engineers face increasingly complex design challenges. Higher operating frequencies, stringent performance requirements, and manufacturability hurdles …

Ansys-Synopsys Technology Update: The Latest Advances in Multi-Die Design

Online

The semiconductor industry is rapidly adopting 2.5D and 3D multi-die designs as the significant benefits have become clear for applications like HPC, GPU, mobile, and AI/ML. Multi-die design technology has been quickly evolving with early experiences leading to the development of more advanced implementation and analysis techniques. For the past years, Synopsys and Ansys have …

Infineon’s GaN Roadshow

Infineon Technologies 198 Champion Court, San Jose, CA, United States

About Event Join us at the Infineon GaN Roadshow stop in San Jose to experience the future of power! This one-day symposium will dive deep into Infineon's Gallium Nitride power …

Webinar: Tackling the Challenges of Functional Safety and Cybersecurity – Virtual Hands-on Workshop

Online

This is a hands-on workshop where the participants will get an opportunity to work with Ansys Medini and perform safety analysis through the Ansys virtual lab. TIME: November 19, 2024 10AM IST to 5PM IST Venue: Virtual Overview Ansys medini analyze is a model-based, integrated tool supporting safety analysis for safety-critical electrical and electronic (E/E) …

Webinar: Accelerating System Design Creation with Integrated Analysis

Online

With the EE Cockpit in Allegro X System Capture, electrical engineers can run analyses during the schematic design phase without needing complicated analysis setups or specialized models to get meaningful results. With in-design analysis, they can provide accurate constraints to the PCB designer and verify that these constraints are met after the design is routed. …