Webinar: Hands-On: How Financial Analysts Use AI PCs for Secure Gen AI Workloads

Online

Independent software vendors (ISVs) are unleashing a new wave of business innovation as they run AI directly on Intel® Core™ Ultra processors. By shifting AI workloads from the cloud to the client, businesses can lower SaaS costs, protect user privacy and data security, and enable novel use cases when AI has access to the full …

Supercomputing 2024 (SC24)

Georgia World Congress Center 285 Andrew Young International Blvd NW, Atlanta, GA, United States

Program Each year, SC provides the leading technical program for professionals and students in the HPC community, as measured by impact, at the highest academic and professional standards. The Program is designed to share best practices in areas such as: algorithms; applications; architectures and networks; clouds and distributed computing; data analytics, visualization, and storage; machine …

Workshop on Open-Source EDA Technology (WOSET)

Online

Workshop on Open-Source EDA Technology The WOSET workshop aims to galvanize the open-source EDA movement. The workshop will (virtually) bring together EDA researchers who are committed to open-source principles to share their experiences and coordinate efforts towards developing a reliable, fully open-source EDA flow. The workshop will feature presentations that overview existing or under-development open-source …

Automotive Computing Conferences 2024

Munich, Germany

WELCOME TO OUR AUTOMOTIVE COMPUTING CONFERENCES (ACC) in 2024 We are excited to explore the transformation of classic vehicles into modern, software-defined vehicles and IoT devices. As the automotive industry evolves, the vehicles of the future demand top-notch computing performance, powerful control units, and adherence to increasingly stringent standards. We face various challenges such as …

Defect-Based Testing

Munich, Germany

Semiconductor and integrated circuit developments continue to proceed at an incredible pace. For example, today's application-specific ICs and microprocessors can contain upwards of 100 million transistors. Traditional testing relies on the stuck-at-fault (SAF) to model defect behavior. Unfortunately, the SAF model is a poor model for defects. Other models and strategies are required to catch …