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Why Integrate Bluetooth LE IP in a Single Wearable SoC?

Why Integrate Bluetooth LE IP in a Single Wearable SoC?
by Eric Esteve on 10-20-2016 at 12:00 pm

Did you know that, in over 800 teardowns of mobile and wearable products from 2012 to 2015, wireless chips outnumbered the actual number of products, indicating multiple wireless ICs in some designs ([SUP]1[/SUP])? It could be interesting to look at the advantages of integrating wireless technology such as Bluetooth low energy… Read More


Circuit Simulation Videos Show How To

Circuit Simulation Videos Show How To
by Daniel Payne on 10-13-2016 at 4:00 pm

One of the things that I miss most about attending trade shows like DAC in the old days was that you actually got to see EDA tools being demonstrated live in the exhibit area. You could see what the GUI looked like, how the dialogs worked, and learn what kind of control you could have during analysis. Most of what you see today at DAC in the… Read More


Machine Learning – Turning Up the Sizzle in EDA

Machine Learning – Turning Up the Sizzle in EDA
by Bernard Murphy on 10-13-2016 at 7:00 am

There’s always a lot of activity in EDA to innovate and refine specialized algorithms in functional modeling, implementation, verification and many other aspects of design automation. But when Google, Facebook, Amazon, IBM and Microsoft are pushing AI, deep learning, Big Data and cloud technologies, it can be hard not to see… Read More


Drift is a Bad Thing for SPICE Circuit Simulators

Drift is a Bad Thing for SPICE Circuit Simulators
by Daniel Payne on 10-07-2016 at 12:00 pm

My first job out of college was with Intel, located in Aloha, Oregon and I did circuit simulations using a proprietary SPICE circuit simulator called ASPEC that was maintained in-house. While doing some circuit simulations one day I noticed that an internal node in one of my circuits was gradually getting higher and higher, even… Read More


Synopsys Hosting Formal Methods in CAD Conference Next Week

Synopsys Hosting Formal Methods in CAD Conference Next Week
by Bernard Murphy on 09-27-2016 at 8:00 pm

SynopsysB

FMCAD (Formal Methods in Computer Aided Design) is a technical conference with a 20-year pedigree. This is a conference for serious formal methods teams. Key notes are from Berkeley and UCLA, committee members are all formal heavyweights and best I can tell, there is no exhibitors area.… Read More


Getting out of DIY Mode for Virtual Prototypes

Getting out of DIY Mode for Virtual Prototypes
by Don Dingee on 09-26-2016 at 4:00 pm

Virtual prototyping has, inexplicably, been largely a DIY thing so far. Tools and models have come from different sources with different approaches, and it has been up to the software development team to do the integration step and cobble together a toolchain and methodology that fits with their development effort.

That integration… Read More


Next Book Signing: Linley Processor Conference 2016!

Next Book Signing: Linley Processor Conference 2016!
by Daniel Nenni on 09-20-2016 at 12:00 pm

It is a busy month for book signings but it is a pleasure to do it for the greater good of the semiconductor industry. It really is an honor to meet the people who keep our electronic devices on the leading edge of technology, absolutely.

The Linley Processor Conference is on September 27[SUP]th[/SUP]and 28[SUP]th[/SUP] at the Hyatt… Read More


A Powerful Case for the ARC SEM Processor

A Powerful Case for the ARC SEM Processor
by Bernard Murphy on 09-12-2016 at 8:06 am

Building devices for the IoT has become especially challenging thanks to two conflicting requirements. The device has to be small and ultra-low power in most applications but also in many of those applications it has to provide a high-level of security, especially to defend high-value targets like smart metering, payment terminals,… Read More


TSMC and Solido to Share Experiences with Managing Variation in Webinar

TSMC and Solido to Share Experiences with Managing Variation in Webinar
by Tom Simon on 09-10-2016 at 7:00 am

TSMC knows better than anyone the effect that variation can have at advanced process nodes. Particularly in memory designs and in standard cell designs, variation has become a very critical because of its effects on yield and because of the high-cost of compensating for it. Smaller feature sizes combined with lower voltage thresholds… Read More


Power-Aware Debug to Find Low-Power Simulation Bugs

Power-Aware Debug to Find Low-Power Simulation Bugs
by Daniel Payne on 09-09-2016 at 12:00 pm

When I worked at Intel designing custom chips my management would often ask me, “Will first silicon work?” My typical response was, “Yes, but only for the functions that we could afford to simulate before tape-out.” This snarky response would always cause a look of alarm, quickly followed by a second … Read More