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WP_Term Object
(
    [term_id] => 89
    [name] => FinFET
    [slug] => finfet
    [term_group] => 0
    [term_taxonomy_id] => 89
    [taxonomy] => category
    [description] => 
    [parent] => 0
    [count] => 225
    [filter] => raw
    [cat_ID] => 89
    [category_count] => 225
    [category_description] => 
    [cat_name] => FinFET
    [category_nicename] => finfet
    [category_parent] => 0
    [is_post] => 
)

Intel 10nm Yield Issues

Intel 10nm Yield Issues
by Scotten Jones on 04-29-2018 at 4:00 pm

On their first quarter earnings call Intel announced that volume production of 10nm has been moved from the second half of 2018 to 2019 due to yield issues. Specifically, they are shipping 10nm in low volume now, but yield improvement has been slower than anticipated. They report that they understand the yield issues but that improvements… Read More


Monitoring Process, Voltage and Temperature in SoCs, webinar recap

Monitoring Process, Voltage and Temperature in SoCs, webinar recap
by Daniel Payne on 04-26-2018 at 4:00 pm

Have you ever wondered how process variation, thermal self-heating and Vdd levels affect the timing and yield of your SoC design? If you’re clock specification calls for 3GHz, while your silicon is only yielding at 2.4GHz, then you have a big problem on your hands. Such are the concerns of many modern day chip designers. To… Read More


Sometimes a Solver is a Suitable Solution

Sometimes a Solver is a Suitable Solution
by admin on 04-17-2018 at 7:00 am

Traditional, rule based, RC extractors rely on a substantial base of assumptions, which are increasingly proving unreliable. Having accurate RC extraction results for parasitic R’s and C’s is extremely important for ensuring proper circuit operation and for optimizing performance and power. Advanced process nodes are making… Read More


A New Problem for High-Performance Mobile

A New Problem for High-Performance Mobile
by Bernard Murphy on 04-04-2018 at 7:00 am

About 6 months ago, ANSYS was approached by a couple of leading mobile platform vendors/suppliers with a challenging problem. These companies were hitting target 2.5GHz performance goals on their (N10 or N7) application processors, but getting about 10% lower yield than expected, which they attributed to performance failures.… Read More


FlexE at SoC IP Days with Open Silicon

FlexE at SoC IP Days with Open Silicon
by Daniel Nenni on 03-30-2018 at 12:00 pm

On Thursday April 5th the Design and Reuse SoC IP days continues in Santa Clara at the Hyatt Regency (my favorite hangout). SemiWiki is a co-sponsor and I am Chairman of the IP Security Track. More than 400 people have registered thus far and I expect a big turnout, if you look at the program you will see why. You should also know that registration… Read More


Free Webinar: Silvaco 3D Solver Based Extraction for Device and Circuit Designers

Free Webinar: Silvaco 3D Solver Based Extraction for Device and Circuit Designers
by admin on 03-20-2018 at 12:00 pm

Designers spend a lot of time looking at their layouts in 2D. This is done naturally because viewing in 2D is faster and simpler than in 3D. It helps that humans are good at extrapolating from 2D to 3D. Analysis software, such as extraction software also spend a lot of time looking at layouts in 2D. While this is fine for approximate results,… Read More


Robust Reliability Verification – A Critical Addition To Baseline Checks

Robust Reliability Verification – A Critical Addition To Baseline Checks
by Alex Tan on 03-01-2018 at 12:00 pm

Design process retargeting is acommon recurrence based on scaling orBOM(Bill-Of-Material) cost improvement needs. This occursnot only with the availability of foundry process refresh to a more advanced node,but also to any new derivative process node tailored towards matching design complexity, power profile or reliabilityRead More


CEO Interview: Rene Donkers of Fractal Technologies

CEO Interview: Rene Donkers of Fractal Technologies
by Daniel Nenni on 02-28-2018 at 7:00 am

We (SemiWiki) have been working with Fractal for close to five years now publishing 25 blogs that have garnered more than 100,000 views. Generally speaking QA people are seen as the unsung heroes of EDA since the only time you really hear about them is when something goes wrong and a tapeout is delayed or a chip is respun.

FinFETs really… Read More


Free Webinar on Standard Cell Statistical Characterization

Free Webinar on Standard Cell Statistical Characterization
by admin on 02-20-2018 at 12:00 pm

Variation analysis continues to be increasingly important as process technology moves to more advanced nodes. It comes as no surprise that tool development in this area has been vigorous and aggressive. New higher reliability IC applications, larger memory sizes and much higher production volumes require sophisticated yield… Read More


What does a Deep Learning Chip Look Like

What does a Deep Learning Chip Look Like
by Daniel Nenni on 02-16-2018 at 12:00 pm

There’s been a lot of discussion of late about deep learning technology and its impact on many markets and products. A lot of the technology under discussion is basically hardware implementations of neural networks, a concept that’s been around for a while.

What’s new is the compute power that advanced semiconductor technology… Read More