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Getting to Faster Closure through AI/ML, DVCon Keynote

Getting to Faster Closure through AI/ML, DVCon Keynote
by Bernard Murphy on 03-10-2022 at 10:00 am

Manish min

Manish Pandey, VP R&D and Fellow at Synopsys, gave the keynote this year. His thesis is that given the relentless growth of system complexity, now amplified by multi-chiplet systems, we must move the verification efficiency needle significantly. In this world we need more than incremental advances in performance. We need… Read More


Upcoming Webinar: 3DIC Design from Concept to Silicon

Upcoming Webinar: 3DIC Design from Concept to Silicon
by Kalar Rajendiran on 01-26-2022 at 10:00 am

Lessons from Existing Multi Die Solutions

Multi-die design is not a new concept. It has been around for a long time and has evolved from 2D level integration on to 2.5D and then to full 3D level implementations. Multiple driving forces have led to this progression.  Whether the forces are driven by market needs, product needs, manufacturing technology availability or EDA… Read More


Heterogeneous Integration – A Cost Analysis

Heterogeneous Integration – A Cost Analysis
by Tom Dillinger on 12-29-2021 at 10:00 am

cost comparison

Heterogeneous integration (HI) is a general term used to represent the diverse possibilities for die technology incorporated into advanced 2.5D/3D packaging.  At the recent International Electron Devices Meeting (IEDM) in San Francisco, a team from Synopsys and IC Knowledge presented data from analyses of future potential… Read More


Delivering Systemic Innovation to Power the Era of SysMoore

Delivering Systemic Innovation to Power the Era of SysMoore
by Kalar Rajendiran on 12-28-2021 at 6:00 am

Evolving Landscape

With the slowing down of Moore’s law , the industry as a whole has been working on various ways to maintain the rate of growth and advancements. A lot has been written up about various solutions being pursued to address specific aspects. The current era is being referred to by different names, SysMoore being one that Synopsys uses.… Read More


Creative Applications of Formal at Intel

Creative Applications of Formal at Intel
by Bernard Murphy on 12-01-2021 at 6:00 am

formal image min

One of the sessions I enjoyed at the Synopsys Verification Day 2021 was a presentation on applying formal to a couple of non-traditional problem domains. I like talks of this kind because formal can sometimes be boxed into a limited set of applications, under-exploiting the potential of the technology. Intel have built a centralized… Read More


Synopsys Expands into Silicon Lifecycle Management

Synopsys Expands into Silicon Lifecycle Management
by Daniel Payne on 11-18-2021 at 10:00 am

SLM, Synopsys

I spoke with Steve Pateras of Synopsys last week to better understand what was happening with their Silicon Lifecycle Management vision, and I was reminded of a Forbes article from last year: Never Heard of Silicon Lifecycle Management? Join the Club. At least two major EDA vendors are now using the relatively new acronym SLM, and… Read More


CDC for MBIST: Who Knew?

CDC for MBIST: Who Knew?
by Bernard Murphy on 11-09-2021 at 6:00 am

CDC for MBIST

Now and again, I enjoy circling back to a topic on which I spent a good deal of time back in my Atrenta days – clock domain crossing analysis (CDC). This is an area that still has opportunity to surprise me at least, in this case looking at CDC analysis around MBIST logic. CDC for MBIST might seem strange. Isn’t everything in test mode synchronous… Read More


AI and ML for Sanity Regressions

AI and ML for Sanity Regressions
by Bernard Murphy on 10-13-2021 at 6:00 am

machine learning for regressions min

You probably know the value proposition for using AI and ML (machine learning) in simulation regressions. There are lots of knobs you can tweak on a simulator, all there to help you squeeze more seconds, or minutes out of a run. If you know how to use those options. But often it’s easier to talk to your friendly AE, get a reasonable default… Read More


IBM and HPE Keynotes at Synopsys Verification Day

IBM and HPE Keynotes at Synopsys Verification Day
by Bernard Murphy on 10-06-2021 at 6:00 am

Synopsys Verification Day 2021 View Ondemand min

I have attended several past Synopsys verification events which I remember as engineering conference room, all-engineer pitches and debates. Effective but aiming for content rather than polish. This year’s event was different. First it was virtual, like most events these days, which certainly made the whole event feel more… Read More


Reliability Analysis for Mission-Critical IC design

Reliability Analysis for Mission-Critical IC design
by Daniel Payne on 09-13-2021 at 10:00 am

reliability analysis min

Mission-critical IC design for segments like automotive, aerospace, defense, medical and 5G have more stringent reliability analysis requirements than consumer electronics, and entails running special simulations for the following concerns:

  • Electromigration analysis
  • IR drop analysis
  • MOS aging
  • High-sigma Monte Carlo
Read More