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WP_Term Object
(
[term_id] => 159
[name] => Siemens EDA
[slug] => siemens-eda
[term_group] => 0
[term_taxonomy_id] => 159
[taxonomy] => category
[description] =>
[parent] => 157
[count] => 757
[filter] => raw
[cat_ID] => 159
[category_count] => 757
[category_description] =>
[cat_name] => Siemens EDA
[category_nicename] => siemens-eda
[category_parent] => 157
[is_post] =>
)
WP_Term Object
(
[term_id] => 159
[name] => Siemens EDA
[slug] => siemens-eda
[term_group] => 0
[term_taxonomy_id] => 159
[taxonomy] => category
[description] =>
[parent] => 157
[count] => 757
[filter] => raw
[cat_ID] => 159
[category_count] => 757
[category_description] =>
[cat_name] => Siemens EDA
[category_nicename] => siemens-eda
[category_parent] => 157
[is_post] =>
)
LVS Challenges at Advanced Nodes
Accurate, comprehensive device recognition, connectivity extraction, netlist generation and, ultimately, circuit comparison becomes more complex with each new process generation. As the number of layers and layer derivations increases the complexity of devices, especially Layout Dependent… Read More
Preventing electrical circuit failure is a growing concern for IC designers today. Certain types of failures such as electrostatic discharge (ESD) events, have well established best practices and design rules that circuit designers should be following. Other issues have emerged more recently, such as how to check circuits… Read More
Flash analog-to-digital converters (ADCs) are commonly used in high-frequency applications such as satellite communications, sampling oscilloscopes, and radar detection. Flash ADC is preferred over other ADC architectures because it is extremely fast and quite simple. However, flash ADC typically requires twice as many… Read More
3D-IC design has become a popular discussion topic in the past few years because of the integration benefits and potential cost savings, so I wanted to learn more about how the DRC and LVS flows were being adapted. My first stop was the Global Semiconductor Alliance web site where I found a presentation about how DRC and LVS flows were… Read More
The goal for automatic test pattern generation (ATPG) is to achieve maximum coverage with the fewest test patterns. This conflicts with the goals of managing power because during test, the IC is often operated beyond its normal functional modes to get the highest quality test results. When switching activity exceeds a device’s… Read More
ISTFA
Silicon Valley is a great location for trade shows and technical conferences, so if you have an interest in test and failure analysis then don’t miss out on the 37th annual International Symposium for Testing and Failure Analysis. This year ISTFA will be held from Sunday, November 13th thru Thursday, November 17th … Read More
Wally Rhines’s keynote at the ARM TechCon was about differentiation and how to use it to create measurable value. We all know what differentiation means in some intuitive sense, but how do you make it measurable? Wally’s answer was that differentiation is a measure of the difficulty of switching suppliers and is best… Read More
Parasitic Extraction—My Head Hurts!by glforte on 10-27-2011 at 10:08 amCategories: EDA, Siemens EDA
By Carey Robertson, Director of Product Marketing, Mentor Graphics
IC physical verification requires a number of different types of checking, the most familiar being design rule checking (DRC), layout vs. schematic (LVS) checking, and parasitic extraction combined with circuit simulation. Fundamentally, it does not matter… Read More