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Q2FY24TessentAI 800X100
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Develop A Complete System Prototype Using Vista VP

Develop A Complete System Prototype Using Vista VP
by Pawan Fangaria on 09-22-2013 at 6:00 pm

Yes, it means complete hardware and software integration, debugging, verification, optimization of performance and power and all other operational aspects of an electronic system in semiconductor design. In modern SoCs, several IPs, RTL blocks, software modules, firmware and so on sit together on a single chip, hence making… Read More


What’s in your network processor?

What’s in your network processor?
by Don Dingee on 09-19-2013 at 8:00 pm

Recently, one of those very restrained press releases – in this case, Mentor Graphics and Imagination Technologiesextending their partnership for MIPS software support– crossed my desk with about 10% of the story. The 90% of this story I want to focus on is why Mentor is putting energy into this partnership… Read More


Mentor Teaches Us About the Higg’s Boson

Mentor Teaches Us About the Higg’s Boson
by Paul McLellan on 09-17-2013 at 4:46 pm

Once a year Mentor has a customer appreciation event in Silicon Valley with a guest speaker on some aspect of science. This is silicon valley, after all, so we all have to be geeks. This year it was Dr Sean Carroll from CalTech on The Particle at the End of the Universe, the Hunt for The Higg’s Boson and What’s Next.

Wally … Read More


Real Time Concurrent Layout Editing – It’s Possible

Real Time Concurrent Layout Editing – It’s Possible
by Pawan Fangaria on 09-03-2013 at 2:00 pm

Layout editing is a complex task, traditionally done manually by designers, and the layout design productivity largely depends on the designer’s skills and expertise. However, a good tool with features for ease of design is a must. Layout productivity has been an area of focus and various features are constantly being added in… Read More


It’s a 14nm photomask, what could possibly go wrong?

It’s a 14nm photomask, what could possibly go wrong?
by Don Dingee on 08-27-2013 at 3:16 pm

Let’s start with the bottom line: in 14nm processes, errors which have typically been little more than noise with respect to photomask critical dimension (CD) control targets at larger process nodes are about to become very significant, even out of control if not accounted for.… Read More


Test, The Forgotten Step-Child of Semiconductor Design

Test, The Forgotten Step-Child of Semiconductor Design
by Paul McLellan on 08-20-2013 at 7:56 pm

Somehow, when designing a chip it is synthesis and place & route that gets all the attention. But it is no good taping out perfect layout without also having away to test the silicon. Somehow, test just isn’t as glamorous.

On September 10-12th is the International Test Conference which, as usual, is at the Disneyland Hotel… Read More


Let’s Drive To Dearborn on 19th Sep….

Let’s Drive To Dearborn on 19th Sep….
by Pawan Fangaria on 08-15-2013 at 11:00 am


[The VLC developed by Edison2, winner of the Progressive Automotive X-Prize]

Now that we have “The Very Light Car” of the world at more than 100 MPG!! Yes, this is the car developed by Edison2, one among the three winners of the Progressive Insurance Automotive X-Prize, a global competition; Edison2 won in the main stream class. … Read More


Scan the horizon, P1687 takes us higher

Scan the horizon, P1687 takes us higher
by Don Dingee on 07-31-2013 at 6:00 pm

The tech standards cycle almost always goes like this: Problems or limits develop with the existing way of doing things. Innovators attempt to engineer solutions, usually many of them. Chaos ensues when customers figure out nothing new works with anything else. Competitors sit down and agree on a specification where things work… Read More


Increasing Automotive Semiconductor Test Quality

Increasing Automotive Semiconductor Test Quality
by glforte on 06-17-2013 at 4:45 pm

The growing amount of electronics within today’s automobiles is driving very high quality and reliability requirements to a widening range of semiconductor devices. At the same time, traditional fault models are becoming less effective at achieving desired silicon quality levels. Improvements in test solutions are needed… Read More