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What’s Testing Design Limits at ITC?

What’s Testing Design Limits at ITC?
by Beth Martin on 10-02-2015 at 12:00 pm

The 46[SUP]th[/SUP] IEEE International Test Conference (ITC) will be held the week of October 5, 2015 at the Disneyland Hotel Conference Center in Anaheim, California. ITC is where you will discover the latest ideas and learn about practical applications of test technologies.

As you take in panels, tutorials, presentations,… Read More


Top 10 Reasons to invest in Interactive Design Rule Checking tools

Top 10 Reasons to invest in Interactive Design Rule Checking tools
by Tom Dillinger on 10-01-2015 at 12:00 pm

One of the most energetic presentations at the recent TSMC OIP 2015 symposium was given by Tom Williams from Qualcomm, who shared his insights (and enthusiasm!) for Mentor’s Calibre RealTime interactive Design Rule Checking (iDRC) product.

Paraphrasing Tom’s presentation (and with a tip of the hat to David Letterman), here … Read More


Together At Last—Combining Netlist and Layout Data for Power-Aware Verification

Together At Last—Combining Netlist and Layout Data for Power-Aware Verification
by Beth Martin on 09-25-2015 at 12:00 pm

The market demanded that gadgets it loves become ever more conscious of their power consumption, and chip designers responded with an array of clever techniques to cut IC power use. Unsurprisingly, these new techniques added to the complexity of IC verification. When you’re verifying a design that has 100+ separate power domains,… Read More


IoT does NOT lack tools!

IoT does NOT lack tools!
by Daniel Nenni on 09-16-2015 at 4:00 pm

Rarely does a month go by without acquisitions in the fabless semiconductor ecosystem. Not surprisingly one of the most read pages on SemiWiki is the EDA Merger and Acquisitions Wiki with more than fifty seven thousand views. It really is a nice family tree, one which we (Daniel Payne) are diligent on keeping current. One of the most… Read More


Moving up Verification to Scenario Driven Methodology

Moving up Verification to Scenario Driven Methodology
by Pawan Fangaria on 09-11-2015 at 12:00 pm

Verification complexity and volume has always been on the rise, taking significant amount of time, human, and compute resources. There are multiple techniques such as simulation, emulation, FPGA prototyping, formal verification, post-silicon testing, and so on which gain prominence in different situations and at different… Read More


Congratulations Dr. Walden C. Rhines!

Congratulations Dr. Walden C. Rhines!
by Daniel Nenni on 09-08-2015 at 1:00 pm

A funny thing happened at the Design Automation Conference last June in San Francisco. I was browsing the Kaufman award winner mug shots in the EDAC booth and noticed that Wally Rhines was NOT a winner. You can see them HERE. Immediately in disbelief I said to myself: Self, how can this be? Joe Costello, Aart de Geus, and some other guys… Read More


Resolution Enhancement Technology – the key to Moore’s Law

Resolution Enhancement Technology – the key to Moore’s Law
by Tom Dillinger on 09-06-2015 at 10:00 am

The ability to extend photolithography utilizing 193i light sources to current process nodes is truly the key technical achievement that has enabled Moore’s Law to continue. The interplay between the exposure equipment, the materials – especially, resists and related coatings – and the fundamental principles… Read More


For high-volume manufacturing at 10 nm and below: technology and friendship

For high-volume manufacturing at 10 nm and below: technology and friendship
by Beth Martin on 09-03-2015 at 4:00 pm

The technology for 10 nm is settled, but what about 7 nm and 5 nm? Those nodes will happen with silicon-based CMOS and 193nm immersion lithography, but exactly how is still being worked out. Right now, though, the focus is on getting 10 nm chips into high-volume production. TSMC and Intel both claim to be on track for high-volume manufacturing… Read More


Test Driving Analog/Mixed Signal Design for the Internet of Things

Test Driving Analog/Mixed Signal Design for the Internet of Things
by Beth Martin on 08-25-2015 at 12:00 pm

The Internet of Things (IoT) is creating urgent demand for a new generation of analog/mixed-signal (AMS) designs, some of which also contain MEMs. To efficiently create the myriad of AMS devices at the edge of the IoT requires a design environment that is affordable and easy to use, but powerful enough to create the widely diverse… Read More


Testing Ethernet with virtual co-modeling

Testing Ethernet with virtual co-modeling
by Don Dingee on 08-24-2015 at 12:00 pm

Ethernet is suddenly a hot topic in SoC design again. The biggest news may be this: it’s not just the cloud and enterprise networks. Those are still important applications. The cloud is driving hard for more ports at 25G server and 100G switch speeds according to a recent Dell’Oro Group report. Enterprise networks are driving for… Read More