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IoT Breakfast Panel at DAC

IoT Breakfast Panel at DAC
by Daniel Payne on 06-03-2014 at 7:21 pm

Tuesday morning at DAC I enjoyed a free breakfast courtesy of Synopsysand GLOBALFOUNDRIESwhere I learned more about the emerging market of IoT, and what it means to semiconductor, EDA and IP vendors. Panelists included: Semico Research, HP, Synopsys, GLOBALFOUNDRIES and Broadcom. … Read More


Ceaseless Field Test for Safety Critical Devices

Ceaseless Field Test for Safety Critical Devices
by Pawan Fangaria on 06-03-2014 at 3:00 am

While focus of the semiconductor industry has shifted to DACin this week and unfortunately I couldn’t attend due to some of my management exams, in my spare time I was browsing through some of the webpages of Cadenceto check their new offerings (although they have a great list of items to showcase at DAC) and to my pleasure I came across… Read More


High Sigma Yield Analysis and Optimization at DAC

High Sigma Yield Analysis and Optimization at DAC
by Daniel Payne on 06-02-2014 at 7:20 pm

When I hear the phrase “high sigma” I think of the EDA vendor Solido, however at DAC on Monday I visited another EDA company called MunEDAthat has several products of interest to transistor-level IC designers. I was able to speak with three different people from MunEDA and here’s what I learned.… Read More


Active Power Management in UPF Using SPICE, VHDL-AMS or Verilog-AMS

Active Power Management in UPF Using SPICE, VHDL-AMS or Verilog-AMS
by Daniel Payne on 05-31-2014 at 9:20 pm

My former co-worker, Kenneth Bakalar at Mentor Graphics is an expert in AMS modeling languages and UPFmethodology, so he recently teamed up with Eric Jeandeau to author an interesting white paper: Interpreting UPF for a Mixed-Signal Design Under Test. This white paper is based on a presentation made at DVCon earlier this year.… Read More


Context Aware Library Models for Improved Static Analysis Accuracy

Context Aware Library Models for Improved Static Analysis Accuracy
by Daniel Nenni on 05-30-2014 at 10:00 pm

Digital semiconductor design flows predominantly use library models (typically verilog and liberty formats) for static analyses. Design sizes continue to grow and geometry continues to shrink. Demand for superior performance continue to increase. Accuracy of the library models has become more critical than ever before … Read More


How About a Quality-Aware IP Design Flow

How About a Quality-Aware IP Design Flow
by Daniel Payne on 05-28-2014 at 6:18 pm

In the EDA world we use hyphens quite often to describe our technical approaches, like: DFM-aware, Power-aware, Variation-aware. I just read a white papertoday on the topic of Quality-Aware IP Design Flows, written by Fractal Technologies. If your group creates IP or re-uses IP, then there’s always the question about … Read More


RedHawk Excels – Customers Endorse

RedHawk Excels – Customers Endorse
by Pawan Fangaria on 05-28-2014 at 11:00 am

Since a few years, I have been following up Ansys Apachetools for semiconductor design, verification and sign-off. RedHawk is the most prominent platform of tools from Ansys, specifically for Power, Noise and Reliability Sign-off. It has witnessed many open endorsements from several of Ansyscustomers through open presentations,… Read More