20nm SoC Design

20nm SoC Design
by Paul McLellan on 08-25-2011 at 12:48 am

There are a large number of challenges at 20nm that didn’t exist at 45nm or even 32nm.

The biggest issues are in the lithography area. Until now it has been possible to make a reticle using advanced reticle enhacement technology (RET) decoration and have it print. Amazing when you think that at 45nm we are making 45nm features… Read More


Silicon One

Silicon One
by Paul McLellan on 08-23-2011 at 5:23 pm

I have talked quite a bit over the last few years about how the trend towards small consumer devices with very fast ramp times. For example, pretty much any time Apple introduces a new product line (iPod, iPhone, iPad…) it becomes the fastest growing market in history. This has major implications for semiconductor design … Read More


Reducing SoC Power Consumption using Integrated Voltage Regulators

Reducing SoC Power Consumption using Integrated Voltage Regulators
by Daniel Nenni on 08-10-2011 at 5:00 pm

Last month I had the pleasure of meeting Mr Wonyoung Kim, a PhD candidate from Harvard University. Like many candidates, Wonyoung is shopping his thesis for capital in hopes of starting a semiconductor IP company. Here is a brief summary of the technology, please provide appropriate feedback and let’s see if we can get him… Read More


August 11th – Hands-on Workshop with Calibre: DRC, LVS, DFM, xRC, ERC

August 11th – Hands-on Workshop with Calibre: DRC, LVS, DFM, xRC, ERC
by Daniel Payne on 08-06-2011 at 9:29 pm

I’ve blogged about the Calibre family of IC design tools before:

Smart Fill replaced Dummy Fill Approach in a DFM Flow
DRC Wiki
Graphical DRC vs Text-based DRC
Getting Real time Calibre DRC Results with Custom IC Editing
Transistor-level Electrical Rule Checking
Who Needs a 3D Field Solver for IC Design?
Prevention is BetterRead More


Chip-Package-System Webinar

Chip-Package-System Webinar
by Paul McLellan on 08-05-2011 at 5:14 pm

The webinar on CPS (chip-package-system) is on Tuesday 9th August at 11am Pacific time. It will be conducted by Christopher Ortiz, Principal Application Engineer at Apache Design Solutions. Dr. Ortiz has been with Apache since 2007, supporting the Sentinel product line. Prior to Apache he worked at Agere / LSI, where he investigated… Read More


Totem webinar: Analog/Mixed-Signal Power Noise and Reliability

Totem webinar: Analog/Mixed-Signal Power Noise and Reliability
by Paul McLellan on 07-30-2011 at 5:26 pm

The Totem webinar will be at 11am on Tuesday 2nd August. This session will be conducted by Karan Sahni, Senior Applications Engineer at Apache Design Solutions. Karan has been with Apache since 2008, supporting the Redhawk, Totem, Sentinel product lines. He received his MS in Electrical Engineering from the Syracuse University… Read More


CDNS EDA360 is DEAD!

CDNS EDA360 is DEAD!
by Daniel Nenni on 07-30-2011 at 3:00 am

Hard to believe EDA360, the Cadence Blueprint toBattle ‘Profitability Gap’; Counters Semiconductor Industry’s Greatest Threat!, is DEAD at the ripe old age of one. As you may have already read John Bruggeman left Cadence after the company conference call last week. The formal announcement should go out on Monday after the SEC… Read More


Global Technology Conference 2011

Global Technology Conference 2011
by Daniel Nenni on 07-24-2011 at 1:13 pm

Competition is what made the semiconductor industry and semiconductors themselves what they are today! Competition is what drives innovation and keeps costs down. Not destructive competition, where the success of one depends on the failure of another, but constructive competition that promotes mutual survival and growth… Read More


Intel Briefing: Tri-Gate Technology and Atom SoC

Intel Briefing: Tri-Gate Technology and Atom SoC
by Daniel Nenni on 07-17-2011 at 3:00 pm

Sorry to disappoint but my 2 hours at the Intel RNB was a very positive experience. It is much more fun writing negative things about industry leaders because I enjoy the resulting hate mail and personal attacks, but the candor and transparency of the Intel guys won me over. They even asked ME questions which was a bit telling. I also… Read More


Design for test at RTL

Design for test at RTL
by Paul McLellan on 07-10-2011 at 3:09 pm

Design for test (DFT) imposes various restrictions on the design so that the test automation tools (automatic test pattern approaches such as scan, as well as built-in self-test approaches) will subsequently be able to generate the test program. For example, different test approaches impose constraints on clock generation… Read More