Often it is considered safer to be pessimistic in estimating IR-drop to maintain power integrity of semiconductor designs; however that leads to the use of extra buffering and routing resources which may not be necessary. In modern high speed, high density SoCs having multiple blocks, memories, analog IPs with different functionalities… Read More
Tag: pdn
Reliability sign-off has several aspects – One Solution
Here, I am talking about reliability of chip design in the context of electrical effects, not external factors like cosmic rays. So, the electrical factors that could affect reliability of chips could be excessive power dissipation, noise, EM (Electromigration), ESD (Electrostatic Discharge), substrate noise coupling and… Read More
Power and Reliability Sign-off – A must, but how?
At the onset of SoCs with multiple functionalities being packed together at the helm of technologies to improve upon performance and area; power, which was earlier neglected, has become critical and needs special attention in designing SoCs. And there comes reliability considerations as well due to multiple electrical and … Read More
Today’s Program is Brought To You by the Letter A
What do nVidia, Freescale and GlobalFoundries have in common? They are semiconductor companies? They are ARM licensees? They are doing 28nm chips? They all have the letter ‘a’ in their names?
All true, but that’s not what I was thinking of. But the letter ‘a’ is a clue since Apache (and Ansys) begin with ‘a’. All three companies have… Read More
Acquiring Great Power
“Before we acquire great power we must acquire wisdom to use it well”
Ralph Waldo Emerson
Making good architectural decisions for controlling power consumption and ensuring power integrity requires a good analysis of the current requirements and how they vary. Low power designs, and today there really aren’t… Read More