WEBINAR: Analog Verification and Characterization with Monte Carlo and High-Sigma Analysis

WEBINAR: Analog Verification and Characterization with Monte Carlo and High-Sigma Analysis
by Daniel Nenni on 06-30-2020 at 9:00 am

Semiconductor companies designing ICs for smart phones, automotive and industrial applications, CPUs, GPUs and memory components all employ teams of custom IC designers to create the highest performance chips that are as small as possible, and at the lowest costs. Designers must verify and characterize their IP’s sensitivity… Read More


Analog IP Migration, Optimization and Verification

Analog IP Migration, Optimization and Verification
by Admin on 03-26-2020 at 11:00 am

Thu, Mar 26, 2020 11:00 AM – 12:00 PM MDT

** Work email address required**

ABSTRACT: Semiconductor companies designing ICs for smart phones, automotive and industrial applications, CPUs, GPUs and memory components all employ teams of custom IC designers to create the highest performance chips that are as small as possible,… Read More


Webinar on Tools and Solutions for Analog IP Migration

Webinar on Tools and Solutions for Analog IP Migration
by Tom Simon on 03-17-2020 at 10:00 am

MunEDA flow for analog design porting

The commonly advanced reason for IP reuse is lower cost and shorter development time. However, IP reuse presents its own challenges, especially for analog designs. In the case of digital designs, once a new standard cell library is available, it is usually not too hard to resynthesize RTL to create new working silicon. For analog… Read More


56th DAC – In Depth Look at Analog IP Migration from MunEDA

56th DAC – In Depth Look at Analog IP Migration from MunEDA
by Tom Simon on 07-31-2019 at 10:00 am

Every year at DAC, in addition to the hubbub of the exhibit floor and the relatively short technical sessions, there are a number of tutorials that dive in depth into interesting topics. At the 56th DAC in Las Vegas this year, MunEDA offered an interesting tutorial on Analog IP migration and optimization. This is a key issue for large… Read More


A Practical Approach to Modeling ESD Protection Devices for Circuit Simulation

A Practical Approach to Modeling ESD Protection Devices for Circuit Simulation
by Tom Simon on 06-03-2019 at 8:00 am

Lurking inside of every Mosfet is a parasitic bipolar junction transistor (BJT). Of course, in normal circuit operation the BJT does not play a role in the device operation. Accordingly, SPICE models for Mosfets do not behave well when the BJT is triggered. However, these models work just fine for most purposes. The one important… Read More


Ten Things to see @ 56thDAC!

Ten Things to see @ 56thDAC!
by Daniel Nenni on 06-01-2019 at 8:00 am

New products always take precedence since EDA is a “mature” market. I have inside knowledge on this one so I can tell you it is not to be missed. Coincidently, but not really, a related white paper was just published so if you are not going to 56thDAC you can still get a virtual briefing. If you are going to DAC be sure and stop by the Fractal… Read More


Free Webinar: Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis

Free Webinar: Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis
by Tom Simon on 04-29-2019 at 4:00 pm

The letters “PVT” roll of the tongue easily enough, belying the complexity that variations in process, temperature and voltage can cause for analog designs. For semiconductor processes, there are dozens of parameters that can affect the viability of a design. It would be easy enough to optimize a circuit with only one or two varying… Read More


Schematic porting – the key to analog design reuse

Schematic porting – the key to analog design reuse
by Tom Simon on 04-02-2018 at 12:00 pm

At the beginning of every project the one of the first questions that ought to be asked is whether there blocks from previous designs that can be reused. On the surface this seems pretty obvious. The wrinkle in this is that reusability varies a lot based on the design type and the effort that a team is willing to expend to bring a design… Read More


Using Sequential Testing to Shorten Monte Carlo Simulations

Using Sequential Testing to Shorten Monte Carlo Simulations
by Tom Simon on 12-27-2017 at 7:00 am

When working on an analog design, after initial design specs have been met, it is useful to determine if the design meets specs out to 3 or 4 sigma based on process variation. This can serve as a useful step before going any further. It might not be a coincidence that foundries base their Cpk on 3-sigma. To refresh, Cpk is the ratio of the… Read More


Seeking Solution for Saving Schematics?

Seeking Solution for Saving Schematics?
by Tom Simon on 11-24-2017 at 7:00 am

Schematics are still the lynchpin of analog design. In the time that HDL’s have revolutionized digital design, schematics have remained drawn and used much as they have been for decades. While the abstraction of HDL based designs has made process and foundry porting relatively straightforward, porting schematic based designs… Read More