Using ML for Statistical Circuit Verification

Using ML for Statistical Circuit Verification
by Daniel Payne on 05-03-2023 at 10:00 am

6 sigma samples statistical circuit

I’ve been following Solido as a start-up EDA vendor since 2005, then they were acquired by Siemens in 2017. At the recent User2User event there was a presentation by Kwonchil Kang, of Samsung Electronics on the topic, ML-enabled Statistical Circuit Verification Methodology using Solido. For high reliability circuits… Read More


DAC 2021 – Taming Process Variability in Semiconductor IP

DAC 2021 – Taming Process Variability in Semiconductor IP
by Daniel Payne on 12-27-2021 at 10:00 am

process node variability min

Tuesday at DAC was actually my very first time attending a technical session, and the presentation from Nebabie Kebebew, Siemens EDA, was called, Mitigating Variability Challenges of IPs for Robust Designs. There were three presentations scheduled for that particular Designer, IP and Embedded Systems track, but with the COVID… Read More


Webinar on Methods for Monte Carlo and High Sigma Analysis

Webinar on Methods for Monte Carlo and High Sigma Analysis
by Tom Simon on 06-12-2020 at 6:00 am

Advanced Monte Carlo Methods

There is an old saying popularized by Mark Twain that goes “There are three kinds of lies: lies, damned lies, and statistics.” It turns out that no one can say who originated this saying, yet despite however you might feel about statistics, they play an important role in verifying analog designs. The truth is that there are large numbers… Read More


A better way to combine PVT and Monte Carlo to improve yield

A better way to combine PVT and Monte Carlo to improve yield
by Tom Simon on 10-11-2017 at 12:00 pm

TSMC held its Open Innovation Platform Forum the other week on September 13[SUP]th[/SUP]. Each year the companies that exhibit at this event choose to highlight their latest technology. One of the most interesting presentations that I received during the event was from Solido. In recent years they have produced a number of groundbreaking… Read More


Solido Debuts New ML Tool at TSMC OIP!

Solido Debuts New ML Tool at TSMC OIP!
by Daniel Nenni on 09-08-2017 at 7:00 am

The TSMC OIP Ecosystem Forum is upon us and what better place to debut a new tool to prevent silicon failures. Solido Design Automation just launched its latest tool – PVTMC Verifier – and will be demonstrating it in their booth at OIP. This is the third product that was developed within its Machine Learning Labs and is… Read More


EDA Machine Learning from the Experts!

EDA Machine Learning from the Experts!
by Daniel Nenni on 08-16-2017 at 7:00 am

Traditionally, EDA has been a brute force methodology where we buy more software licenses and more CPUs and keep running endless jobs to keep up with the increasing design and process complexities. SPICE simulation for example; when I meet chip designers (which I do quite frequently) I ask them how many simulations they do for a … Read More


Machine Learning and EDA!

Machine Learning and EDA!
by Daniel Nenni on 04-21-2017 at 7:00 am

Semiconductor design is littered with complex, data-driven challenges where the cost of error is high. Solido’s new ML (machine learning) Labs, based on Solido’s ML technologies developed over the last 12 years, allows semiconductor companies to collaboratively work with Solido in developing new ML-based EDA products.

Data… Read More


Machine Learning Accelerates Library Characterization by 50 Percent!

Machine Learning Accelerates Library Characterization by 50 Percent!
by Daniel Nenni on 04-06-2017 at 7:00 am

Standard cell, memory, and I/O library characterization is a necessary, but time-consuming, resource intensive, and error-prone process. With the added complexity of advanced and low power manufacturing processes, fast and accurate statistical and non-statistical characterization is challenging, creating the need … Read More


Solutions for Variation Analysis at 16nm and Beyond

Solutions for Variation Analysis at 16nm and Beyond
by Tom Simon on 09-22-2016 at 7:00 am

Variation is still the tough nut to crack for advanced process nodes. The familiar refrain of lower operating voltages and higher performance requirements make process variation an extremely important design consideration. As far back as the early 2000’s design teams have been looking for a better approach to model variation… Read More


Solido Saves Silicon with Six Sigma Simulation

Solido Saves Silicon with Six Sigma Simulation
by Tom Simon on 08-16-2016 at 4:00 pm

When pushing the boundaries of power and performance in leading edge memory designs, yield is always an issue. The only way to ensure that memory chips will yield is through aggressive simulation, especially at process corners to predict the effects of variation. In a recent video posted on the Solido website, John Barth of Invecas… Read More