Let’s Drive To Dearborn on 19th Sep….

Let’s Drive To Dearborn on 19th Sep….
by Pawan Fangaria on 08-15-2013 at 11:00 am


[The VLC developed by Edison2, winner of the Progressive Automotive X-Prize]

Now that we have “The Very Light Car” of the world at more than 100 MPG!! Yes, this is the car developed by Edison2, one among the three winners of the Progressive Insurance Automotive X-Prize, a global competition; Edison2 won in the main stream class. … Read More


Robust Design <- Robust Flow <- Robust Tools

Robust Design <- Robust Flow <- Robust Tools
by Pawan Fangaria on 08-10-2013 at 6:00 pm

I could have written the sequence of the title in reverse order, but no, design is the one which initiates the need of a particular flow and the flow needs support of EDA tools to satisfy that need. It’s okay if the design is small; some manual procedures and workarounds/scripts may be able to perform certain jobs. However, as the design… Read More


Best Practices for Using DRC, LVS and Parasitic Extraction – on YouTube

Best Practices for Using DRC, LVS and Parasitic Extraction – on YouTube
by Daniel Payne on 07-10-2013 at 1:21 pm

EDA companies produce a wealth of content to help IC engineers get the best out of their tools through several means:

  • Reference Manuals
  • User Guides
  • Tutorials
  • Workshops
  • Seminars
  • Training Classes
  • Phone Support
  • AE visits
Read More

Towards the 0 DPM Test Goal

Towards the 0 DPM Test Goal
by Paul McLellan on 07-10-2013 at 10:43 am

At Semicon yesterday I attended Mentor’s presentation on improving test standards. Joe Sawicki was meant to present but he was unable to get a flight due to the ongoing disruption at SFO after last weekend’s crash. I just flew in myself and it is odd to see the carcase of that 777 just beside the runway we landed on.

The … Read More


DAC: Wally’s Vision

DAC: Wally’s Vision
by Paul McLellan on 06-06-2013 at 3:07 pm

One new feature at DAC this year is that several of the keynotes are preceded by a ten minute vision of the future from one of the EDA CEOs. Today it was Wally Rhines’s turn. Wally is CEO of Mentor Graphics. He titled his talk Changing the World Through EDA. Since EDA as we know it started in the late 1970s, the number of transistors… Read More


Atrenta: Mentor/Spyglass Power Signoff…and a Book

Atrenta: Mentor/Spyglass Power Signoff…and a Book
by Paul McLellan on 05-30-2013 at 7:00 am

Today Atrenta and Mentor announced that they were collaborating to enable accurate, signoff quality power estimation at the RTL for entire SoCs. The idea is to facilitate RTL power estimation for designs of over 50M gates running actual software loads over hundreds of millions of cycles, resulting in simulation datasets in the… Read More


Cell-Aware Test Seminar

Cell-Aware Test Seminar
by Beth Martin on 05-07-2013 at 8:05 pm

You may have heard about cell-aware testing. It’s a transistor-level test (ATPG) methodology that is quickly becoming a hot topic. If you are involved in DFT and are looking for better quality and reliability, you should definitely know about cell-aware testing.


And lucky you, on May 16, 2013, you can attend a free seminar on cell-aware… Read More


A Programmable Electrical Rule Checker

A Programmable Electrical Rule Checker
by Daniel Payne on 04-29-2013 at 11:21 pm

IC designers involved with physical design are familiar with acronyms like DRC (Design Rule Check), LVS (Layout Versus Schematic) and DFM (Design For Manufacturing), but how would you go about checking for compliance with ESD (Electro Static Discharge) rules? You may be able to kludge something together with your DRC tool and… Read More


Mentor Graphics’ Best User2User Ever

Mentor Graphics’ Best User2User Ever
by Beth Martin on 04-23-2013 at 5:45 pm

Calling all Mentor users! Don’t forget to register for the U2U in San Jose on Thursday, April 25.

In addition to three worthy keynotes, you will find a more interactive and solution-focused day than in the past. There are sessions on place & route, custom/AMS, emulation, test and yield analysis, functional verification, Calibre… Read More