SilabTech Awarded 2013 Best Start-up in India

SilabTech Awarded 2013 Best Start-up in India
by Eric Esteve on 01-20-2014 at 8:32 am

This is obviously great news for SilabTech, and this is the type of news which will change the perception that we (non-Indian) have of the Semiconductor industry in India. About 15-20 years ago, the India Embedded/VLSI industry was perceived as low cost design resource pool, a good place where to implement design center. The hidden… Read More


Managing Heat for System Reliability

Managing Heat for System Reliability
by Pawan Fangaria on 01-17-2014 at 8:30 am

In most of the electronic equipments, semiconductor chips are a major source of heat generation. And in semiconductor designs several hardware and software techniques are being used to contain power dissipation; a major cause for heat. However due to multiple functionality being squeezed into small form factors, we continue… Read More


New Frontiers in Scan Diagnosis

New Frontiers in Scan Diagnosis
by Paul McLellan on 01-03-2014 at 8:10 pm

As we move down into more and more advanced process nodes, the rules of how we test designs are having to change. One big challenge is the requirement to zoom in and fix problems by doing root cause analysis on test data alone, along with the rest of the design data such as detailed layout, optical proximity correction and so on. But without… Read More


Macro Placement Challenges

Macro Placement Challenges
by Paul McLellan on 12-27-2013 at 7:28 pm

One of the challenges of physical design of a modern SoC is that of macro placement. Back when a design just had a few macros then the flooplanning could be handled largely manually. But modern SoCs suffer from a number of problems. A new white paper from Mentor covers Olympus-SOCs features to address these issues:

  • As we move to smaller
Read More

Highest Test Quality in Shortest Time – It’s Possible!

Highest Test Quality in Shortest Time – It’s Possible!
by Pawan Fangaria on 12-26-2013 at 10:30 am

Traditionally ATPG (Automatic Test Pattern Generation) and BIST (Built-In-Self-Test) are the two approaches for testing the whole semiconductor design squeezed on an IC; ATPG requires external test equipment and test vectors to test targeted faults, BIST circuit is implemented on chip along with the functional logic of IC.… Read More


Mentor Buys Oasys

Mentor Buys Oasys
by Paul McLellan on 12-14-2013 at 1:24 pm

Mentor is acquiring Oasys, subject to all the usual caveats about shareholder and regulatory approval. The shareholder paperwork went out earlier this week. The common stock is valueless so presumably the price is low (and Mentor historically has not paid high prices for its acquisitions).

So what is going to happen with the technology?… Read More


Cadence Design Systems’ Shares Are Surprisingly Cheap

Cadence Design Systems’ Shares Are Surprisingly Cheap
by Ashraf Eassa on 11-17-2013 at 10:00 pm

In the third and final (for now) part of this series on the EDA design tool vendors, I’d like to take a closer look at Cadence Design Systems. This is probably the most interesting of the three from both an industry perspective as well as an investment perspective for a variety of reasons. With that said I’d like to first provide some … Read More


Running Multiple Operating Systems: Hypervisors

Running Multiple Operating Systems: Hypervisors
by Paul McLellan on 11-08-2013 at 9:19 am

How do you run multiple operating systems on the same processor? You use virtualization and you run a hypervisor underneath all the so-called “guest” operating systems. So what is virtualization?


Virtualization started with VM/370 developed in 1972 at IBM (the current version is still in use). Here is how it works.… Read More


Debugging Complex Embedded System – How Easy?

Debugging Complex Embedded System – How Easy?
by Pawan Fangaria on 11-08-2013 at 9:00 am

In today’s world of semiconductor design with SoCs having complex IPs, hardware and software working together on a single chip, it’s hard to imagine a system without embedded software into it. But it is easy to guess how difficult it would be to test that hardware and software embedded system. And often there is limited window of … Read More


Diagnosing Double Patterning Violations

Diagnosing Double Patterning Violations
by Beth Martin on 10-28-2013 at 5:16 pm

I’ll bet you’ve read a bunch of stuff about double patterning, and you’re probably hoping that the design tools will make all your double patterning issues just go away. Well, the truth is that the foundries and EDA vendors have worked really hard to make that true.

However, for some critical portions of your design, there … Read More