Robust Reliability Verification: Beyond Traditional Tools
by Matthew Hogan, Mentor Graphics
At all process nodes, countless hours are diligently expended to ensure that our integrated circuit (IC) designs will function in the way we intended, can be manufactured with satisfactory yields, and are delivered in a timely fashion… Read More
Tag: esd
Layout-based ESD Check Methodology with Fast, Full-chip Static and Macro-level Dynamic
Nvidia designs some of the most powerful graphics chips and systems in the world, so I’m always eager to learn more about their IC design methodology. This week I’ve had the chance to talk with Ting Ku, Director of Engineering at Nvidia about his DAC talkin the Apache booth in exactly two weeks from today. Registration… Read More
ESD – Key issue for IC reliability, how to prevent?
It’s a common electrical rule that when large amount of charge gets accumulated, it tries to break any of its surrounding isolation. Although it wouldn’t have been prominent in 1980s or 90s, protection for ICs from such damaging effects is a must, specifically in large mixed-signal designs of today, working at different voltages… Read More
First Time, Every Time
While this iconic advertising phrase was first used to describe the ink reliability of a ballpoint pen, it perfectly summarizes the average consumer’s attitude toward automobile reliability as well. We don’t really care how it’s done, as long as everything in our car works first time, every time. Even when that includes heated… Read More
ESD Check Methodology
In Pune at the start of the month, Norman Chang, Ting-Sheng Ku, Jai Pollayil of Apache/Ansys and NVIDIA presented and ESD check methodologywith Fast Full-chip Static and Macro-level Dynamic Solutions . ESD stands for Elecro-Static Discharge and is basically injecting very high static voltages (think how your hand gets charged… Read More
Automating Complex Circuit Checking Tasks
By Hend Wagieh, Mentor Graphics
At advanced IC technology nodes, circuit designers are now encountering problems such as reduced voltage supply headroom, increased wiring parasitic resistance (Rp) and capacitance (Cp), more restrictive electromigration (EM) rules, latch-up, and electrostatic discharge (ESD) damage,… Read More
PathFinder webinar: Full-chip ESD Integrity and Macro-level Dynamic ESD
The PathFinder webinar will be at 11am Pacific time on Thursday 4th August. It will be conducted by Karthik Srinivasan, Senior Applications Engineer at Apache Design Solutions. Mr. Srinivasan has over four years of experience in the EDA industry, focusing on die, system, and cross-domain analysis. His professional interests… Read More
Low Power Webinar Series
At DAC 2011 in San Diego, Apache gave many product presentations. Of course not everyone could make DAC or could make all the presentations in which they were interested. So from mid-July until mid-August these presentations will be given as webinars. Details, and links for registration, are here on the Apache website.
The seminars… Read More
Analyzing and Planning Electro-static Discharge (ESD) Protection
ESD has historically been a big problem analyzed with ad-hoc approaches. As explained earlier, this is no longer an adequate way to plan nor signoff ESD protection.
Pathfinder is the first full-chip comprehensive ESD planning and verification solution. It is targeted to address limitations in today’s methodologies.… Read More
Electro-static Discharge (ESD)
Electro-static discharge (ESD) has been a problem since the beginning of IC production. Chips function on power supplies of up to a few volts (depending on the era) whereas ESD voltages are measured in the thousands of volts. When you reach out for your car door handle and a spark jumps across, that is ESD. If you were touching a chip… Read More