Traditionally ATPG (Automatic Test Pattern Generation) and BIST (Built-In-Self-Test) are the two approaches for testing the whole semiconductor design squeezed on an IC; ATPG requires external test equipment and test vectors to test targeted faults, BIST circuit is implemented on chip along with the functional logic of IC.… Read More
Founded back in 1984, Silvaco has been in business for some 29 years now, focusing on the TCAD and EDA markets.
Browsing their Home page at www.silvaco.com we find four social media links in the footer: Facebook, Twitter, YouTube and LinkedIn.… Read More
One of the questions that Calypto is asked all the time is what is the difference between sequential logical equivalence checking (SLEC) and logical equivalence checking (LEC).
LEC is the type of equivalence checking that has been around for 20 years, although like all EDA technologies gradually getting more powerful. LEC is … Read More
It is that time of year and once again Atrenta has produced a video wishing you all the best for the holiday season. They are so spread around the world it is not just Hanukkah and Christmas but the Asian Lunar New Year (end of January) and probably some more holidays I don’t even know about. Last year there was a competition to name… Read More
Formal approaches and security are a perfect match since you really want to prove that there are no holes in your security, rather than just being fairly confident. At the recent Jasper User Group meeting, Victor Purri presented some case studies in security verification.
The Jasper Security Path Verification (SPV) App is used… Read More
Mentor is acquiring Oasys, subject to all the usual caveats about shareholder and regulatory approval. The shareholder paperwork went out earlier this week. The common stock is valueless so presumably the price is low (and Mentor historically has not paid high prices for its acquisitions).
So what is going to happen with the technology?… Read More
Donald Rumsfeld categorized what we knew into known unknowns and unknown unknowns. In a chip design, those unknown unknowns can bite you and leave you with a non-functional design, perhaps even intermittent failures which can be among the hardest problems to debug.
Chips are too big to do any sort of full gate-level simulation,… Read More
Yesterday Cadence had their annual front-end summit, the theme of which was physically aware design. I was especially interested in the first couple of presentations about physically aware synthesis. I joined Cadence in 1999 when they acquired Ambit Design Systems. One of the products that we had in development was called PKS… Read More
In an environment of SoCs with tough targets of multiple functionalities, smallest size, lowest power and fastest performance to achieve within a limited design cycle window in order to meet the rigid time-to-market requirements, any day spent without success becomes very frustrating for a designer. Especially during tape-out… Read More
The MOS-AK/GSA Modeling Working Group, a global compact modeling standardization forum, delivered its annual autumn compact modeling workshop on Sept. 20, 2013 as an integral part of the ESSDERC/ESSCIRC Conference in Bucharest (RO). The event received full sponsorship from leading industrial partners including Agilent… Read More
