Boost the Market for Interposer and 3D ICs with Assembly Design Kits

Boost the Market for Interposer and 3D ICs with Assembly Design Kits
by Beth Martin on 07-29-2015 at 6:00 pm

The traditional system-on-chip (SoC) design process has fully qualified verification methods embodied in the form of process design kits (PDKs). Why is it that chip design companies and assembly houses have no IC/package co-design sign-off verification process?

Package die are often produced using multiple processes and… Read More


Will 3DIC Ever Be Cheap Enough for High Volume Products?

Will 3DIC Ever Be Cheap Enough for High Volume Products?
by Paul McLellan on 12-12-2014 at 8:00 pm

More news from the 3DASIP conference. Chet Palesko of SavanSys Solution had an interesting presentation with the same title as this blog (although this blog draws from several other presentations too). Chet took a look at what aspects of 3D are likely to get cheaper going forward. He took as a starting point that stuff that is not … Read More


3D, The State of the State

3D, The State of the State
by Paul McLellan on 12-11-2014 at 8:00 am

I have been at the 3D ASIP conference that is held every year in Burlingame. It is far and away the best place to get a snapshot on what is going on in 3D (and 2.5D) IC design each year. One of the presentations was by the guys from Yole on where the industry is right now. Other presentations were on pathfinding, power reduction (did you know… Read More


3DIC in Burlingame

3DIC in Burlingame
by Paul McLellan on 12-01-2014 at 7:00 am

Every year in December is what I think of as the main 3D IC conference where you can get up to speed on all the latest. Officially it is called 3D Architectures for Semiconductor and Packaging or 3D ASIP. It is held in the Hyatt Regency in Burlingame (the one right by 101 near the airport). This year it is from December 10-12th.

The first… Read More


Solution for PI, TI & SI Issues in 3D-ICs

Solution for PI, TI & SI Issues in 3D-ICs
by Pawan Fangaria on 11-30-2014 at 7:00 pm

As we move towards packing more and more functionalities and increasing densities of SoCs, the power, thermal and signal integrity issues keep on rising. 3D-IC is a great concept to stack multiple dies on top of each other vertically. While it brings lot of avenues to package dies with multiple functions together, it has challenges… Read More


Noise & Reliability of FinFET Designs – Success Stories!

Noise & Reliability of FinFET Designs – Success Stories!
by Pawan Fangaria on 11-01-2014 at 7:00 am

I think by now there has been good level of discussion on FinFET technology at sub-20 nm process nodes and this is an answer to ultra dense, high performance, low power, and billion+ gate SoC designs within the same area. However, it comes with some of the key challenges with respect to power, noise and reliability of the design. A FinFET… Read More


ANSYS Tools Shine at FinFET Nodes!

ANSYS Tools Shine at FinFET Nodes!
by Pawan Fangaria on 09-30-2014 at 4:00 pm

In the modern semiconductor ecosystem we are seeing rapid advancement in technology breaking past once perceived limits; 28nm, 20nm, 16-14nm, 10nm and we are foreseeing 7nm now. Double and multi-patterning are already being seen along with complex FinFET structures in transistors to gain the ultimate advantages in PPA from… Read More


The Intel Resurgence?

The Intel Resurgence?
by Daniel Nenni on 06-30-2014 at 8:00 am

There is an interesting article on Seeking Alpha about Intel. Interesting because it is written by someone with both fabless semiconductor experience and a talent for strategic thinking. It’s a good read and like most Seeking Aplha semiconductor articles the comments are hilarious. Give the guy a penny and click over HERE, he … Read More


RedHawk Excels – Customers Endorse

RedHawk Excels – Customers Endorse
by Pawan Fangaria on 05-28-2014 at 11:00 am

Since a few years, I have been following up Ansys Apachetools for semiconductor design, verification and sign-off. RedHawk is the most prominent platform of tools from Ansys, specifically for Power, Noise and Reliability Sign-off. It has witnessed many open endorsements from several of Ansyscustomers through open presentations,… Read More


Fast & Accurate Thermal Analysis of 3D-ICs

Fast & Accurate Thermal Analysis of 3D-ICs
by Pawan Fangaria on 04-14-2014 at 11:00 am

As Moore’s law started saturating on a single semiconductor die, the semiconductor community came up with the approach of growing vertically by stacking dies one above other in a 3D-IC arrangement. However, a major concern with a 3D-IC is that the heat generated by each die can get trapped in the stack, and hence it’s extremely important… Read More