Talking Sense With Moortec – The Future Of Embedded Monitoring Part 2

Talking Sense With Moortec – The Future Of Embedded Monitoring Part 2
by Stephen Crosher on 02-28-2020 at 10:00 am

Stephen Crosher Moortec CEO Square High Res

The rate of product development is facing very real challenges as the pace of silicon technology evolution begins to slow. Today, we are squeezing the most out of transistor physics, which is essentially derived from 60-year-old CMOS technology. To maintain the pace of Moore’s law, it is predicted that in 2030 we will need transistors… Read More


The Future Of Embedded Monitoring – February 2020

The Future Of Embedded Monitoring – February 2020
by Stephen Crosher on 02-14-2020 at 10:00 am

Stephen Crosher SemiWiki

Shall I compare thee to a…Rolls Royce jet engine?

‘There is a new era dawning whereby deeply embedded sensing within all technology will bring about great benefit for the reliability and performance of semiconductor-based products.’  These were my words during a presentation to an industry audience in China back in SeptemberRead More


TSMC OIP Overview and Agenda!

TSMC OIP Overview and Agenda!
by Daniel Nenni on 09-05-2019 at 6:00 am

The TSMC Symposium and OIP Ecosystem Fourm are the most coveted events of the year for the fabless semiconductor ecosystem, absolutely. In my 35 years of semiconductor experience never has there been a more exciting time in the ecosystem and that is clear by the overview and agenda for this year’s event. I hope to see you there:… Read More


Meeting Automotive IC Design Challenges for Safety using On-Chip Sensors

Meeting Automotive IC Design Challenges for Safety using On-Chip Sensors
by Daniel Payne on 05-09-2019 at 7:00 am

I’ve been driving cars since 1978 and have even done a few DIY repairs in the garage, so I know how warm the engine compartment, transmission or exhaust system can become which makes automotive IC design rather unique in terms of the high temperature and voltage ranges that an electronic component is subjected to. Our safety… Read More


Data Centers and AI Chips Benefit from Embedded In-Chip Monitoring

Data Centers and AI Chips Benefit from Embedded In-Chip Monitoring
by Daniel Payne on 03-08-2019 at 12:00 pm

Webinars are a quick way to come up to speed with emerging trends in our semiconductor world, so I just finished watching an interesting one from Moortec about the benefits of embedded in-chip monitoring for Data Center and AIchip design. My first exposure to a data center was back in the 1960s during an elementary school class where… Read More


Accuracy of In-Chip Monitoring for Thermal Guard-banding

Accuracy of In-Chip Monitoring for Thermal Guard-banding
by Daniel Payne on 01-28-2019 at 12:00 pm

I remember working at Intel and viewing my first SPICE netlist for a DRAM chip, because there was this temperature statement with a number after it, so being a new college graduate I asked lots of questions, like, “What is that temperature value?”

My co-worker answered, “Oh, that’s the estimated junction… Read More


Making AI Silicon Smart with PVT Monitoring

Making AI Silicon Smart with PVT Monitoring
by Tom Simon on 11-26-2018 at 7:00 am

PVT – depending on what field you are in those three letters may mean totally different things. In my undergraduate field of study, chemistry, PVT meant Pressure, Volume & Temperature. Many of you probably remember PV=nRT, the dreaded ideal gas law. However, anybody working in semiconductors knows that PVT stands … Read More


A Smart Way for Chips to Deal with PVT Issues

A Smart Way for Chips to Deal with PVT Issues
by Tom Simon on 10-30-2018 at 7:00 am

We have all become so used to ‘smart’ things that perhaps in a way we have forgotten what it was like before many of the things we use day to day had sensors and microprocessors to help them respond to their environment. Cars are an excellent example. It used to be commonplace to run down your battery by leaving your lights on. Now cars … Read More


Make Versus Buy for Semiconductor IP used in PVT Monitoring

Make Versus Buy for Semiconductor IP used in PVT Monitoring
by Daniel Payne on 10-01-2018 at 12:00 pm

As an IC designer I absolutely loved embarking on a new design project, starting with a fresh, blank slate, not having to use any legacy blocks. In the early 1980’s we really hadn’t given much thought to re-using semiconductor IP because each new project typically came with a new process node, so there was no IP even ready… Read More


Improving Yield and Reliability with In-Chip Monitoring, there’s an IP for that

Improving Yield and Reliability with In-Chip Monitoring, there’s an IP for that
by Daniel Payne on 08-24-2018 at 12:00 pm

There’s an old maxim that you can only improve what you measure, so quality experts have been talking about this concept for decades and our semiconductor industry has been the recipient of such practices to such an extent that we can now buy consumer products that include chips with over 5 billion transistors in them. You’ve… Read More