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GLOBALFOUNDRIES and Mentor Develop Methods to Identify Critical Features in IC Designs

GLOBALFOUNDRIES and Mentor Develop Methods to Identify Critical Features in IC Designs
by glforte on 11-28-2012 at 3:00 pm

Since the beginning of the semiconductor industry, improving the rate of yield learning has been a critical factor in the success silicon manufacturing. Each fab has dedicated yield teams that look at the yield of wafers manufactured the previous day and attempt to find the root cause of any unexpected “excursions.” In earlier… Read More


Mentor and NXP Demonstrate that IJTAG Can Reduce Test Setup Time for Complex SoCs

Mentor and NXP Demonstrate that IJTAG Can Reduce Test Setup Time for Complex SoCs
by glforte on 11-15-2012 at 8:10 pm

The creation of test patterns for mixed signal IP has been, to a large extent, a manual effort. To improve the process used to test, access, and control embedded IP, a new IEEE P1687 standard is being defined by a broad coalition of IP vendors, IP users, major ATE companies, and all three major EDA vendors. This new standard, also called… Read More


Test and Diagnosis at ISTFA

Test and Diagnosis at ISTFA
by Beth Martin on 11-15-2012 at 7:10 pm

Finding and debugging failures on integrated circuits has become increasingly difficult. Two sessions at ISTFA (International Symposium for Testing and Failure Analysis) on Thursday address the current best practices and research directions of diagnosis.

The first was a tutorial this morning by Mentor Graphics luminary… Read More


Creating Plug-and-Play IP Networks in Large SoCs with IEEE P1687 (IJTAG)

Creating Plug-and-Play IP Networks in Large SoCs with IEEE P1687 (IJTAG)
by glforte on 11-14-2012 at 2:15 pm

Until now, the integration and testing of IP blocks used in large SOCs has been a manual, time consuming design effort. A new standard called IEEE P1687 (or “IJTAG”) for IP plug-and-play integration is emerging to simplify these tasks. EDA tools are also emerging to support the new standard. Last week mentor announcedTessent IJTAG,… Read More


IJTAG, Testing Large SoCs

IJTAG, Testing Large SoCs
by Paul McLellan on 11-08-2012 at 5:57 pm

Test is the Rodney Dangerfield of EDA, it doesn’t get any respect. All designs need to be tested but somehow synthesis, routing, analog layout and the rest are the sexy areas. In my spoof all purpose EDA keynote address I even dissed it:You are short on time so slip in a quick mention of manufacturing test. Who knows anything … Read More


A Most Significant Man

A Most Significant Man
by Beth Martin on 11-06-2012 at 8:10 pm

Most of us live perfectly good lives without distinction, fame, or note. Others rack up the honors, filling their walls and resumes with recognition of their brilliance. Like Dr. Janusz Rajski.

Rajski is the director of engineering for the test products at Mentor Graphics, an IEEE Fellow, and the inventor of embedded deterministic… Read More


Chip On Wafer On Substrate (CoWoS)

Chip On Wafer On Substrate (CoWoS)
by Daniel Payne on 11-03-2012 at 5:19 pm

tsmc cowos test vehicle1

Our EDA industry loves three letter acronyms so credit the same industry for creating a five letter acronym CoWoS. Two weeks ago TSMC announced tape-out of their first CoWoS test chip integrating with JEDEC Wide I/O mobile DRAM interface, making me interested enough to read more about it. At the recent TSMC Open Innovation Platform… Read More


SoC emulation syncs up with SuperSpeed USB

SoC emulation syncs up with SuperSpeed USB
by Don Dingee on 10-25-2012 at 9:00 pm

They say what adds value is to take something difficult and make it look simple. USB looks so simple when it is done right, but designers know it can be one of the more tempermental features in an SoC, especially in the latest SuperSpeed incarnation.… Read More


Model Driven Development

Model Driven Development
by Paul McLellan on 10-25-2012 at 5:50 pm

Mentor has a webinar on Model Driven Development (MDD) for Systems Engineering, presented by Bill Chown. It is actually the first of 15 webinars. This first one is just over 30 minutes long and I assume the others will be too. The webinar focuses on embedded system development, which historically has largely been validated using… Read More


TSMC dilemma: Cadence, Mentor or Synopsys?

TSMC dilemma: Cadence, Mentor or Synopsys?
by Eric Esteve on 10-18-2012 at 4:49 am

Looking at the Press Release (PR) flow, it was interesting to see how TSMC has solved a communication dilemma. At first, let’s precise that #1 Silicon foundry has to work with each of the big three EDA companies. As a foundry, you don’t want to lose any customer, and then you support every major design flow. Choosing another strategy… Read More