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Q2FY24TessentAI 800X100
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Let’s Drive To Dearborn on 19th Sep….

Let’s Drive To Dearborn on 19th Sep….
by Pawan Fangaria on 08-15-2013 at 11:00 am


[The VLC developed by Edison2, winner of the Progressive Automotive X-Prize]

Now that we have “The Very Light Car” of the world at more than 100 MPG!! Yes, this is the car developed by Edison2, one among the three winners of the Progressive Insurance Automotive X-Prize, a global competition; Edison2 won in the main stream class. … Read More


Scan the horizon, P1687 takes us higher

Scan the horizon, P1687 takes us higher
by Don Dingee on 07-31-2013 at 6:00 pm

The tech standards cycle almost always goes like this: Problems or limits develop with the existing way of doing things. Innovators attempt to engineer solutions, usually many of them. Chaos ensues when customers figure out nothing new works with anything else. Competitors sit down and agree on a specification where things work… Read More


Increasing Automotive Semiconductor Test Quality

Increasing Automotive Semiconductor Test Quality
by glforte on 06-17-2013 at 4:45 pm

The growing amount of electronics within today’s automobiles is driving very high quality and reliability requirements to a widening range of semiconductor devices. At the same time, traditional fault models are becoming less effective at achieving desired silicon quality levels. Improvements in test solutions are needed… Read More


Hardware Assisted Verification

Hardware Assisted Verification
by Paul McLellan on 06-10-2013 at 9:00 pm

On the Tuesday of DAC I moderated a panel session on Hardware Assisted Verification in 10 Years: More Need, More Speed. Although this topic obviously could include FPGA-based prototyping, in fact we spent pretty much the whole time talking about emulation. Gary Smith, on Sunday night, actually set up things by pointing out that… Read More


DAC: Wally’s Vision

DAC: Wally’s Vision
by Paul McLellan on 06-06-2013 at 3:07 pm

One new feature at DAC this year is that several of the keynotes are preceded by a ten minute vision of the future from one of the EDA CEOs. Today it was Wally Rhines’s turn. Wally is CEO of Mentor Graphics. He titled his talk Changing the World Through EDA. Since EDA as we know it started in the late 1970s, the number of transistors… Read More


Robust Reliability Verification: Beyond Traditional Tools and Techniques

Robust Reliability Verification: Beyond Traditional Tools and Techniques
by SStalnaker on 05-31-2013 at 7:10 pm

Robust Reliability Verification: Beyond Traditional Tools
by Matthew Hogan, Mentor Graphics

At all process nodes, countless hours are diligently expended to ensure that our integrated circuit (IC) designs will function in the way we intended, can be manufactured with satisfactory yields, and are delivered in a timely fashion… Read More


DAC lunch seminar: Better IP Test with IEEE P1687

DAC lunch seminar: Better IP Test with IEEE P1687
by Beth Martin on 05-30-2013 at 7:28 pm

What: DAC lunch seminar (register here)
When: June 5, 2013, 11:30am – 1:30pm
Where: At DAC in lovely Austin, TX

Dr. Martin Keim of Mentor Graphics will present this overview of the new the IEEE P1687 standard, called IJTAG for ‘internal’ JTAG.

If you are involved in IC test*, you’ve probably heard about IJTAG. If you … Read More


Bats about DAC!

Bats about DAC!
by SStalnaker on 05-23-2013 at 8:05 pm

DAC 2013 is closing in fast now…and if you haven’t made your plans for what you want to see and do, you’d better get going! Of course, I’m happy to help you out with a few suggestions…starting with that most important objective—conference swag. Stop by the Mentor Graphics booth (#2046, for those of you who actually look at your floor… Read More


IC Place and Route Perspective from Users at DAC

IC Place and Route Perspective from Users at DAC
by Daniel Payne on 05-22-2013 at 11:44 am

One of the most useful ways to learn about an EDA tool is to talk with other users that have experience with that tool. IC Place and Route tools are complex and yet necessary to implement every SoC designed today, so at DAC in just two weeks you have a chance to hear first-hand from several P&R tool users. To get a better idea about these… Read More