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Automotive Safety Island: Test, Safety, Security, ISO 26262

Automotive Safety Island: Test, Safety, Security, ISO 26262
by Daniel Payne on 07-12-2021 at 10:00 am

functional safety

I first fell in love with electric vehicles back in 1978 as an Electrical Engineering student, studying at the University of Minnesota. What caught my fancy was a small advertisement listed in the back of Popular Mechanics magazine to build your own electric vehicle by replacing the gas engine of a Honda with an electric motor, so… Read More


CEO Interview: Harald Neubauer of MunEDA

CEO Interview: Harald Neubauer of MunEDA
by Daniel Nenni on 07-09-2021 at 6:00 am

Harald Neubauer CEO of MunEDA

It has been my pleasure to interview Harald Neubauer, CEO of MunEDA. A veteran of the EDA industry, Harald cofounded MunEDA in 2001.

What brought you to the EDA industry?

Well, I always wanted to found a tech startup and was developing and evaluating various business ideas together with my later cofounder Andreas. Soon after we got… Read More


The Design Lifecycle of an Electronics Interface

The Design Lifecycle of an Electronics Interface
by Kalar Rajendiran on 07-08-2021 at 6:00 am

Product Process Organizational Complexities

We live in a world run by electronics systems. With the exception of completely isolated systems, all others take inputs, process them and produce outputs. The value of a system is determined not only by how well it processes the inputs but also by how well it handles inputs and outputs. Handling in this context means, how much data… Read More


Driving PPA Optimization Across the Cubic Space of 3D IC Silicon Stacks

Driving PPA Optimization Across the Cubic Space of 3D IC Silicon Stacks
by Tom Simon on 07-06-2021 at 9:00 am

Improved PPA Using 3D IC

The move to true 3D IC, monolithic 3D SOC and 3D heterogeneous integration may require one of the most major design tool architecture overhauls since IC design tools were first developed. While we have been taking steps toward 3DIC with 2.5D designs with interposers, HBM, etc., the fundamental tools and flows remain intact in many… Read More


The Quest for Bugs: “Correct by Design!”

The Quest for Bugs: “Correct by Design!”
by Bryan Dickman on 07-04-2021 at 6:00 am

Title Image

In this article we take an objective view of Virtual Prototyping from the engineering lens and the “quest to find bugs”. In this instance we discuss the avoidance of bugs in terms of architecting complex ASICs to be “correct by design”.

AI Challenges

It is not surprising to find out that other areas of human endeavour, beyond semiconductor… Read More


Achieving Scalability Means No More Silos

Achieving Scalability Means No More Silos
by Mike Gianfagna on 07-01-2021 at 6:00 am

Achieving Scalability Means No More Silos

This is a story of contrasts and counter-intuitive results. Perforce recently published a white paper discussing enterprise scalability – what it takes, why it’s important and what can get in the way. The discussion will shake up some long-held notions regarding effective project management. The results can be significant,… Read More


Safety + Security for Automotive SoCs with ASIL B Compliant tRoot HSMs

Safety + Security for Automotive SoCs with ASIL B Compliant tRoot HSMs
by Kalar Rajendiran on 06-30-2021 at 10:00 am

New Architectures Reshaping Auto SoCs

Automotive segment is a market that has historically been supported by a few select suppliers within the semiconductor ecosystem. Over the last decade, this market has transitioned from just being about reliability, performance, fuel efficiency, etc., to placing equal importance to user experience. This user experience … Read More


What’s New with UVM and UVM Checking?

What’s New with UVM and UVM Checking?
by Daniel Nenni on 06-30-2021 at 6:00 am

UVM and UVM Checking

About once a quarter, I touch base with Cristian Amitroaie, CEO and co-founder of AMIQ EDA, to see what’s new with the company, products, and users. Sometimes he surprises me, as he did earlier this year when he mentioned that their tools check about 150 rules for non-standard constructs in SystemVerilog and VHDL. When we talked … Read More


Neural Nets and CR Testing. Innovation in Verification

Neural Nets and CR Testing. Innovation in Verification
by Bernard Murphy on 06-29-2021 at 10:00 am

Instrumenting Post-Silicon Validation

Leveraging neural nets and CR testing isn’t as simple as we first thought. But is that the last word in combining these two techniques? Paul Cunningham (GM, Verification at Cadence), Raúl Camposano (Silicon Catalyst, entrepreneur, former Synopsys CTO) and I continue our series on research ideas. As always, feedback welcome.… Read More


Siemens Offers Insights into Gate Level CDC Analysis

Siemens Offers Insights into Gate Level CDC Analysis
by Tom Simon on 06-28-2021 at 10:00 am

CDC Analysis

Glitches on clock domain crossing signals have always been a concern for chip designers. Now with increased requirements for reliability, renewed scrutiny is being given to find ways to identify these problems and fix them. In particular applications such as automotive electronics have given this added effort an impetus. Siemens… Read More