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Metamorphic Test in AMS. Innovation in Verification

Metamorphic Test in AMS. Innovation in Verification
by Bernard Murphy on 03-26-2025 at 6:00 am

Innovation New

We have talked about metamorphic testing before. Here is a clever application to testing an AMS subsystem. Paul Cunningham (GM, Verification at Cadence), Raúl Camposano (Silicon Catalyst, entrepreneur, former Synopsys CTO and lecturer at Stanford, EE292A) and I continue our series on research ideas. As always, feedback welcome.… Read More


Webinar: RF board design flow examples for co-simulating active circuits

Webinar: RF board design flow examples for co-simulating active circuits
by Don Dingee on 03-25-2025 at 10:00 am

Mesh domain optimization

In part one of this webinar series, Keysight and Modelithics looked at the use of 3D passive vendor component models supporting highly accurate, automated 3D EM-circuit co-simulation of high-frequency RF board designs. Part two continues the exploration of RF board design flows for simulating active circuits on boards, again… Read More


Going Beyond DRC Clean with Calibre DE

Going Beyond DRC Clean with Calibre DE
by Mike Gianfagna on 03-24-2025 at 6:00 am

Going Beyond DRC Clean with Calibre DE

For advanced semiconductor designs, achieving both design rule check clean layouts and optimal electrical performance is crucial for minimizing design iterations, reducing time-to-market and ensuring product reliability. Balancing electrical performance and layout integrity is a difficult task. Achieving an optimal… Read More


Cut Defects, Not Yield: Outlier Detection with ML Precision

Cut Defects, Not Yield: Outlier Detection with ML Precision
by Kalar Rajendiran on 03-20-2025 at 10:00 am

Part Average Testing

How much perfectly good silicon is being discarded in the quest for reliability? During high-volume chip manufacturing, aggressive testing with strict thresholds may ensure quality but reduces yield, discarding marginal chips that could function flawlessly. On the other hand, prioritizing yield risks allowing defective… Read More


Compute and Communications Perspectives on Automotive Trends

Compute and Communications Perspectives on Automotive Trends
by Bernard Murphy on 03-19-2025 at 6:00 am

Automotive Growth Pillars min

Automotive electronics is a fast-moving space, especially around sensing and distilling intelligence from that sensing. This serves three main pillars: autonomy, electrification and advances in the car cockpit. Autonomy at multiple levels remains an important goal and continues to advance, technically and geographically.… Read More


Video EP2: A Detailed Look at the Most Effective Way to Conquer Clock Jitter with Samia Rashid

Video EP2: A Detailed Look at the Most Effective Way to Conquer Clock Jitter with Samia Rashid
by Daniel Nenni on 03-14-2025 at 10:00 am

In this episode of the Semiconductor Insiders video series, Dan is joined by Samia Rashid, co-founder and president of Infinisim. Samia provides detailed background on clock jitter – what it is, what causes it and the various methods to address the problem. Samia describes the unique clock analysis technology developed… Read More


Siemens Fleshes out More of their AI in Verification Story

Siemens Fleshes out More of their AI in Verification Story
by Bernard Murphy on 03-13-2025 at 6:00 am

AI maximizing verification productivity min

While Cadence and Synopsys were sharing a lot of detail over the past few years about what they were doing in AI, Siemens EDA seemed content to offer a very general picture about their intentions without getting into a lot of detail. At DVCon 2025 they finally pulled back the curtain. Why wait until now to announce?

Darron May (Director… Read More


Speeding Up Physical Design Verification for AMS Designs

Speeding Up Physical Design Verification for AMS Designs
by Daniel Payne on 03-10-2025 at 6:00 am

mismatch min

Custom and analog/mixed-signal IC designs have some unique IP and symmetry checking requirements for physical design. Waiting until the end of the IC layout process to verify IP instances for correctness or proper symmetry will cause project delays, so an approach to perform earlier physical verification makes more sense. … Read More


S2C: Empowering Smarter Futures with Arm-Based Solutions

S2C: Empowering Smarter Futures with Arm-Based Solutions
by Daniel Nenni on 03-07-2025 at 8:00 am

S2c EDA ARM 2025

The tech world is sprinting toward a future where your fridge orders groceries, your car avoids traffic before you hit it, and security cameras don’t just watch—they understand. But behind these innovations lies a messy truth: building the brains for these smart systems is complicated.

Fresh off the 2024 Arm Tech Symposia… Read More


DVCon 2025: AI and the Future of Verification Take Center Stage

DVCon 2025: AI and the Future of Verification Take Center Stage
by Lauro Rizzatti on 03-06-2025 at 10:00 am

DVCon 2025

The 2025 Design and Verification Conference (DVCon) was a four-day event packed with insightful discussions, cutting-edge technology showcases, and thought-provoking debates. The conference agenda included a rich mix of tutorial sessions, a keynote presentation, a panel discussion, and an exhibit hall with Electronic… Read More