Gate Resistance in IC design flow

Gate Resistance in IC design flow
by Maxim Ershov on 05-03-2023 at 6:00 am

Figure1 9

MOSFET gate resistance is a very important parameter, determining many characteristics of MOSFETs and CMOS circuits, such as:

• Switching speed
• RC delay
• Fmax – maximum frequency of oscillations
• Gate (thermal) noise
• Series resistance and quality factor in MOS capacitors and varactors
• Switching speed and uniformity… Read More


Bizarre results for P2P resistance and current density (100x off) in on-chip ESD network simulations – why?

Bizarre results for P2P resistance and current density (100x off) in on-chip ESD network simulations – why?
by Maxim Ershov on 12-12-2022 at 6:00 am

Fig 1

Resistance checks between ESD diode cells and pads or power clamps, and current density analysis for such current flows are commonly used for ESD networks verification [1]. When such simulations use standard post-layout netlists generated by parasitic extraction tools, the calculated resistances may be dramatically higher… Read More


Your Symmetric Layouts show Mismatches in SPICE Simulations. What’s going on?

Your Symmetric Layouts show Mismatches in SPICE Simulations. What’s going on?
by Maxim Ershov on 11-07-2022 at 6:00 am

Figure1 6

This Diakopto paper discusses for the first time, a new effect – a false electrical mismatch in post-layout simulations for perfectly symmetric nets. This effect is caused by the difference in distributions of parasitic coupling capacitors over the nodes of parasitic resistor networks, even for symmetric nets. This, in turn,… Read More