Full-Chip Electromigration Analysis

Full-Chip Electromigration Analysis
by Daniel Payne on 10-10-2014 at 7:00 am

I’ll never forget debugging my first DRAM chip at Intel, peering into a microscope and watching the aluminum interconnect actually bubble and dissolve as the voltage was increased, revealing the destructive effects of Electromigration (EM) failure. That was back in 1980 using 6 um, single level metal technology, so imagine… Read More


Xilinx picks another winner…

Xilinx picks another winner…
by Luke Miller on 07-31-2013 at 7:00 pm

Just as important as block RAMs, IO and DSP48’s is what interconnect or fabric is going to be used when considering SoC FPGA designs. I think Xilinx has found the winning combination. What is paramount to the new SoC FPGA methodologies is not only the challenge of moving huge amounts of data around; we are now to consider data… Read More


High Frequency Analysis of IC Layouts

High Frequency Analysis of IC Layouts
by Daniel Payne on 10-03-2012 at 12:26 pm

IC designers of passive devices often use empirical approaches to perform High Frequency Analysis (HFA), however there is at least one new approach being offered by Mentor Graphics using a tool flow of:

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